X-ray Microanalysis of Insulators in the ESEM

M.R. Phillips, M. Toth, Brendan Griffin

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationMicroscopy and Microanalysis 2000
EditorsG.W. Bailey
Place of PublicationNew York
PublisherSpringer
Pages786-787
Volume6
EditionPhiladelphia, Pennsylvania
Publication statusPublished - 2000
EventX-ray Microanalysis of Insulators in the ESEM - Philadelphia, Pennsylvania
Duration: 1 Jan 2000 → …

Conference

ConferenceX-ray Microanalysis of Insulators in the ESEM
Period1/01/00 → …

Cite this

Phillips, M. R., Toth, M., & Griffin, B. (2000). X-ray Microanalysis of Insulators in the ESEM. In G. W. Bailey (Ed.), Microscopy and Microanalysis 2000 (Philadelphia, Pennsylvania ed., Vol. 6, pp. 786-787). New York: Springer.