X-ray Microanalysis of Insulators in the ESEM

M.R. Phillips, M. Toth, Brendan Griffin

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Microscopy and Microanalysis 2000
Editors	G.W. Bailey
Place of Publication	New York
Publisher	Springer
Pages	786-787
Volume	6
Edition	Philadelphia, Pennsylvania
Publication status	Published - 2000
Event	X-ray Microanalysis of Insulators in the ESEM - Philadelphia, Pennsylvania Duration: 1 Jan 2000 → …

Conference	X-ray Microanalysis of Insulators in the ESEM
Period	1/01/00 → …

Cite this

@inproceedings{7cafa065b45d49e3824bb95251ca2af4,

title = "X-ray Microanalysis of Insulators in the ESEM",

author = "M.R. Phillips and M. Toth and Brendan Griffin",

year = "2000",

language = "English",

volume = "6",

pages = "786--787",

editor = "G.W. Bailey",

booktitle = "Microscopy and Microanalysis 2000",

publisher = "Springer",

address = "Netherlands",

edition = "Philadelphia, Pennsylvania",

note = "X-ray Microanalysis of Insulators in the ESEM ; Conference date: 01-01-2000",

}