X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques

M.R. Phillips; Brendan Griffin; D. Drouin; C. Nockolds; G. Remond

X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques

M.R. Phillips, Brendan Griffin, D. Drouin, C. Nockolds, G. Remond

Centre for Microscopy, Characterisation & Analysis

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Proceedings Microscopy and Microanalysis 2001
Editors	G.W. Bailey, R.L. Price, E. Voelkl, I.H. Musselman
Place of Publication	USA
Publisher	Springer
Pages	708-709
Volume	7 (Suppl 2: Proceedings)
Edition	Long Beach, California, USA
ISBN (Print)	14319276
Publication status	Published - 2001
Event	X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques - Long Beach, California, USA Duration: 1 Jan 2001 → …

Conference

Conference	X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques
Period	1/01/01 → …

Cite this

Phillips, M. R., Griffin, B., Drouin, D., Nockolds, C., & Remond, G. (2001). X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques. In G. W. Bailey, R. L. Price, E. Voelkl, & I. H. Musselman (Eds.), Proceedings Microscopy and Microanalysis 2001 (Long Beach, California, USA ed., Vol. 7 (Suppl 2: Proceedings), pp. 708-709). Springer.

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title = "X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques",

author = "M.R. Phillips and Brendan Griffin and D. Drouin and C. Nockolds and G. Remond",

year = "2001",

language = "English",

isbn = "14319276",

volume = "7 (Suppl 2: Proceedings)",

pages = "708--709",

editor = "G.W. Bailey and R.L. Price and E. Voelkl and I.H. Musselman",

booktitle = "Proceedings Microscopy and Microanalysis 2001",

publisher = "Springer",

address = "Netherlands",

edition = "Long Beach, California, USA",

note = "X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques ; Conference date: 01-01-2001",

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Phillips, MR, Griffin, B, Drouin, D, Nockolds, C & Remond, G 2001, X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques. in GW Bailey, RL Price, E Voelkl & IH Musselman (eds), Proceedings Microscopy and Microanalysis 2001. Long Beach, California, USA edn, vol. 7 (Suppl 2: Proceedings), Springer, USA, pp. 708-709, X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques, 1/01/01.

X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques. / Phillips, M.R.; Griffin, Brendan; Drouin, D. et al.
Proceedings Microscopy and Microanalysis 2001. ed. / G.W. Bailey; R.L. Price; E. Voelkl; I.H. Musselman. Vol. 7 (Suppl 2: Proceedings) Long Beach, California, USA. ed. USA: Springer, 2001. p. 708-709.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques

AU - Phillips, M.R.

AU - Griffin, Brendan

AU - Drouin, D.

AU - Nockolds, C.

AU - Remond, G.

PY - 2001

Y1 - 2001

M3 - Conference paper

SN - 14319276

VL - 7 (Suppl 2: Proceedings)

SP - 708

EP - 709

BT - Proceedings Microscopy and Microanalysis 2001

A2 - Bailey, G.W.

A2 - Price, R.L.

A2 - Voelkl, E.

A2 - Musselman, I.H.

PB - Springer

CY - USA

T2 - X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques

Y2 - 1 January 2001

ER -