X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques

M.R. Phillips, Brendan Griffin, D. Drouin, C. Nockolds, G. Remond

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationProceedings Microscopy and Microanalysis 2001
EditorsG.W. Bailey, R.L. Price, E. Voelkl, I.H. Musselman
Place of PublicationUSA
PublisherSpringer
Pages708-709
Volume7 (Suppl 2: Proceedings)
EditionLong Beach, California, USA
ISBN (Print)14319276
Publication statusPublished - 2001
EventX-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques - Long Beach, California, USA
Duration: 1 Jan 2001 → …

Conference

ConferenceX-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques
Period1/01/01 → …

Cite this

Phillips, M. R., Griffin, B., Drouin, D., Nockolds, C., & Remond, G. (2001). X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques. In G. W. Bailey, R. L. Price, E. Voelkl, & I. H. Musselman (Eds.), Proceedings Microscopy and Microanalysis 2001 (Long Beach, California, USA ed., Vol. 7 (Suppl 2: Proceedings), pp. 708-709). USA: Springer.
Phillips, M.R. ; Griffin, Brendan ; Drouin, D. ; Nockolds, C. ; Remond, G. / X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques. Proceedings Microscopy and Microanalysis 2001. editor / G.W. Bailey ; R.L. Price ; E. Voelkl ; I.H. Musselman. Vol. 7 (Suppl 2: Proceedings) Long Beach, California, USA. ed. USA : Springer, 2001. pp. 708-709
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title = "X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques",
author = "M.R. Phillips and Brendan Griffin and D. Drouin and C. Nockolds and G. Remond",
year = "2001",
language = "English",
isbn = "14319276",
volume = "7 (Suppl 2: Proceedings)",
pages = "708--709",
editor = "G.W. Bailey and R.L. Price and E. Voelkl and I.H. Musselman",
booktitle = "Proceedings Microscopy and Microanalysis 2001",
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Phillips, MR, Griffin, B, Drouin, D, Nockolds, C & Remond, G 2001, X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques. in GW Bailey, RL Price, E Voelkl & IH Musselman (eds), Proceedings Microscopy and Microanalysis 2001. Long Beach, California, USA edn, vol. 7 (Suppl 2: Proceedings), Springer, USA, pp. 708-709, X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques, 1/01/01.

X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques. / Phillips, M.R.; Griffin, Brendan; Drouin, D.; Nockolds, C.; Remond, G.

Proceedings Microscopy and Microanalysis 2001. ed. / G.W. Bailey; R.L. Price; E. Voelkl; I.H. Musselman. Vol. 7 (Suppl 2: Proceedings) Long Beach, California, USA. ed. USA : Springer, 2001. p. 708-709.

Research output: Chapter in Book/Conference paperConference paper

TY - GEN

T1 - X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques

AU - Phillips, M.R.

AU - Griffin, Brendan

AU - Drouin, D.

AU - Nockolds, C.

AU - Remond, G.

PY - 2001

Y1 - 2001

M3 - Conference paper

SN - 14319276

VL - 7 (Suppl 2: Proceedings)

SP - 708

EP - 709

BT - Proceedings Microscopy and Microanalysis 2001

A2 - Bailey, G.W.

A2 - Price, R.L.

A2 - Voelkl, E.

A2 - Musselman, I.H.

PB - Springer

CY - USA

ER -

Phillips MR, Griffin B, Drouin D, Nockolds C, Remond G. X-ray microanalysis in the environmental SEM using mapping and fourier deconvolution techniques. In Bailey GW, Price RL, Voelkl E, Musselman IH, editors, Proceedings Microscopy and Microanalysis 2001. Long Beach, California, USA ed. Vol. 7 (Suppl 2: Proceedings). USA: Springer. 2001. p. 708-709