Write/Erase Degradation in Souce Side Injection Flash EEPROMs

D. Wellekens, J. Van Houdt, Lorenzo Faraone, G. Groeseneken, H.E. Maes

    Research output: Contribution to journalArticle

    26 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)1992-1998
    JournalIEEE Transactions on Electron Devices
    Volume42
    Issue number11
    Publication statusPublished - 1995

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