Write/Erase Degradation in Souce Side Injection Flash EEPROMs

D. Wellekens, J. Van Houdt, Lorenzo Faraone, G. Groeseneken, H.E. Maes

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1992-1998
Journal	IEEE Transactions on Electron Devices
Volume	42
Issue number	11
Publication status	Published - 1995

Cite this

@article{469c81daf55b4723a2b98120ec722ad7,

title = "Write/Erase Degradation in Souce Side Injection Flash EEPROMs",

author = "D. Wellekens and {Van Houdt}, J. and Lorenzo Faraone and G. Groeseneken and H.E. Maes",

year = "1995",

language = "English",

volume = "42",

pages = "1992--1998",

journal = "IEEE Transactions on Electron Devices",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

number = "11",

}