Wide Field of View Versus High Spatial Resolution and High Sensitivity - the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals

Robert Ulfig; Steven Reddy; David Saxey; Will Rickard; Denis Fougerouse; Mark Pearce; Louise Fisher; Matt Kilburn; Paul Gagliardo; Peter H. Clifton; David A. Reinhard; David J. Larson

doi:10.1093/micmic/ozad067.393

Wide Field of View Versus High Spatial Resolution and High Sensitivity - the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals

Robert Ulfig
, Steven Reddy
, David Saxey
, Will Rickard
, Denis Fougerouse
, Mark Pearce
, Louise Fisher
, Matt Kilburn
, Paul Gagliardo
, Peter H. Clifton
, David A. Reinhard
, David J. Larson

School of Earth and Oceans

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	790-791
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	29
Issue number	1
DOIs	https://doi.org/10.1093/micmic/ozad067.393
Publication status	Published - 22 Jul 2023

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10.1093/micmic/ozad067.393

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Ulfig, R., Reddy, S., Saxey, D., Rickard, W., Fougerouse, D., Pearce, M., Fisher, L., Kilburn, M., Gagliardo, P., Clifton, P. H., Reinhard, D. A., & Larson, D. J. (2023). Wide Field of View Versus High Spatial Resolution and High Sensitivity - the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals. Microscopy and Microanalysis, 29(1), 790-791. https://doi.org/10.1093/micmic/ozad067.393

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title = "Wide Field of View Versus High Spatial Resolution and High Sensitivity - the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals",

author = "Robert Ulfig and Steven Reddy and David Saxey and Will Rickard and Denis Fougerouse and Mark Pearce and Louise Fisher and Matt Kilburn and Paul Gagliardo and Clifton, \{Peter H.\} and Reinhard, \{David A.\} and Larson, \{David J.\}",

year = "2023",

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doi = "10.1093/micmic/ozad067.393",

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Ulfig, R, Reddy, S, Saxey, D, Rickard, W, Fougerouse, D, Pearce, M, Fisher, L, Kilburn, M, Gagliardo, P, Clifton, PH, Reinhard, DA & Larson, DJ 2023, 'Wide Field of View Versus High Spatial Resolution and High Sensitivity - the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals', Microscopy and Microanalysis, vol. 29, no. 1, pp. 790-791. https://doi.org/10.1093/micmic/ozad067.393

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T1 - Wide Field of View Versus High Spatial Resolution and High Sensitivity - the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals

AU - Ulfig, Robert

AU - Reddy, Steven

AU - Saxey, David

AU - Rickard, Will

AU - Fougerouse, Denis

AU - Pearce, Mark

AU - Fisher, Louise

AU - Kilburn, Matt

AU - Gagliardo, Paul

AU - Clifton, Peter H.

AU - Reinhard, David A.

AU - Larson, David J.

PY - 2023/7/22

Y1 - 2023/7/22

UR - https://www.scopus.com/pages/publications/85168579158

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DO - 10.1093/micmic/ozad067.393

M3 - Article

C2 - 37613609

SN - 1435-8115

VL - 29

SP - 790

EP - 791

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 1

ER -

Wide Field of View Versus High Spatial Resolution and High Sensitivity - the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals

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