Wide Field of View Versus High Spatial Resolution and High Sensitivity - the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals

Robert Ulfig; Steven Reddy; David Saxey; Will Rickard; Denis Fougerouse; Mark Pearce; Louise Fisher; Matt Kilburn; Paul Gagliardo; Peter H. Clifton; David A. Reinhard; David J. Larson

doi:10.1093/micmic/ozad067.393

Wide Field of View Versus High Spatial Resolution and High Sensitivity - the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals

Robert Ulfig, Steven Reddy, David Saxey, Will Rickard, Denis Fougerouse, Mark Pearce, Louise Fisher, Matt Kilburn, Paul Gagliardo, Peter H. Clifton, David A. Reinhard, David J. Larson

School of Earth and Oceans

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	790-791
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	29
Issue number	1
DOIs	https://doi.org/10.1093/micmic/ozad067.393
Publication status	Published - 22 Jul 2023

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10.1093/micmic/ozad067.393

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Ulfig, R., Reddy, S., Saxey, D., Rickard, W., Fougerouse, D., Pearce, M., Fisher, L., Kilburn, M., Gagliardo, P., Clifton, P. H., Reinhard, D. A., & Larson, D. J. (2023). Wide Field of View Versus High Spatial Resolution and High Sensitivity - the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals. Microscopy and Microanalysis, 29(1), 790-791. https://doi.org/10.1093/micmic/ozad067.393

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author = "Robert Ulfig and Steven Reddy and David Saxey and Will Rickard and Denis Fougerouse and Mark Pearce and Louise Fisher and Matt Kilburn and Paul Gagliardo and Clifton, {Peter H.} and Reinhard, {David A.} and Larson, {David J.}",

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doi = "10.1093/micmic/ozad067.393",

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Ulfig, R, Reddy, S, Saxey, D, Rickard, W, Fougerouse, D, Pearce, M, Fisher, L, Kilburn, M, Gagliardo, P, Clifton, PH, Reinhard, DA & Larson, DJ 2023, 'Wide Field of View Versus High Spatial Resolution and High Sensitivity - the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals', Microscopy and Microanalysis, vol. 29, no. 1, pp. 790-791. https://doi.org/10.1093/micmic/ozad067.393

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T1 - Wide Field of View Versus High Spatial Resolution and High Sensitivity - the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals

AU - Ulfig, Robert

AU - Reddy, Steven

AU - Saxey, David

AU - Rickard, Will

AU - Fougerouse, Denis

AU - Pearce, Mark

AU - Fisher, Louise

AU - Kilburn, Matt

AU - Gagliardo, Paul

AU - Clifton, Peter H.

AU - Reinhard, David A.

AU - Larson, David J.

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DO - 10.1093/micmic/ozad067.393

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VL - 29

SP - 790

EP - 791

JO - Microscopy and Microanalysis

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IS - 1

ER -

Wide Field of View Versus High Spatial Resolution and High Sensitivity - the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals

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