Wide Field of View Versus High Spatial Resolution and High Sensitivity - the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals

Robert Ulfig, Steven Reddy, David Saxey, Will Rickard, Denis Fougerouse, Mark Pearce, Louise Fisher, Matt Kilburn, Paul Gagliardo, Peter H. Clifton, David A. Reinhard, David J. Larson

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)790-791
Number of pages2
JournalMicroscopy and Microanalysis
Issue number1
Publication statusPublished - 22 Jul 2023

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