Whispering-Gallery Mode Technique Applied to the Measurement of the Dielectric Properties of Langasite Between 4 K and 300 K

V. Giordano, John Hartnett, J. Krupka, [No Value] Kersale Y., P-Y. Bourgeois, Michael Tobar

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

We report new measurements of dielectricproperties of Lanthanum gallium silicate (Langasite orLGS) conducted with the whispering-gallery mode techniqueat microwave frequencies and between 4.2 K and300 K. The real part of the permittivity tensor of LGSpresents two components having temperature coefficients ofopposite sign. This unique property enables the design of atemperature compensated resonator that may be useful inbuilding stable microwave oscillators or filters. We reportalso the first measurements of the two independent componentsof the imaginary part of the permittivity tensor.It appears LGS is a relatively high-loss dielectric materialcompared with sapphire or quartz.
Original languageEnglish
Pages (from-to)484-490
JournalIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Volume51
Issue number5
DOIs
Publication statusPublished - 2004

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