Very-High Q Microwave Spectroscopy on Trapped 171yb+ Ions: Application as a Frequency Standard.

P.T.H. Fisk, M.J. Sellars, M.A. Lawn, C. Coles, Anthony Mann, David Blair

Research output: Contribution to journalArticle

36 Citations (Scopus)
Original languageEnglish
Pages (from-to)113-116
JournalIEEE Transactions on Instrumentation and Measurement
Volume44
Issue number2
Publication statusPublished - 1995

Cite this

Fisk, P.T.H. ; Sellars, M.J. ; Lawn, M.A. ; Coles, C. ; Mann, Anthony ; Blair, David. / Very-High Q Microwave Spectroscopy on Trapped 171yb+ Ions: Application as a Frequency Standard. In: IEEE Transactions on Instrumentation and Measurement. 1995 ; Vol. 44, No. 2. pp. 113-116.
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Very-High Q Microwave Spectroscopy on Trapped 171yb+ Ions: Application as a Frequency Standard. / Fisk, P.T.H.; Sellars, M.J.; Lawn, M.A.; Coles, C.; Mann, Anthony; Blair, David.

In: IEEE Transactions on Instrumentation and Measurement, Vol. 44, No. 2, 1995, p. 113-116.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Very-High Q Microwave Spectroscopy on Trapped 171yb+ Ions: Application as a Frequency Standard.

AU - Fisk, P.T.H.

AU - Sellars, M.J.

AU - Lawn, M.A.

AU - Coles, C.

AU - Mann, Anthony

AU - Blair, David

PY - 1995

Y1 - 1995

M3 - Article

VL - 44

SP - 113

EP - 116

JO - Institute of Electrical and Electronics Engineers Transactions on Instrumentation and Measurement

JF - Institute of Electrical and Electronics Engineers Transactions on Instrumentation and Measurement

SN - 0018-9456

IS - 2

ER -