Projects per year
Abstract
A low cost thermography system capable of submilliKelvin resolution has been developed and will be described through this work. The instrument is applied to the study of low thermal conductivity porous silicon films, which is a challenge given that thermography has previously been developed to study only thin (released) films or highly conducting films on insulating substrates. Our preliminary results indicate that the system is capable of measuring porous silicon thin films on highly conducting substrates, but requires application of the pertinent underlying physics for parameter determination.
Original language | English |
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Title of host publication | 2018 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2018 |
Place of Publication | Australia |
Publisher | IEEE, Institute of Electrical and Electronics Engineers |
Pages | 16-18 |
Number of pages | 3 |
ISBN (Electronic) | 9781538695241 |
DOIs | |
Publication status | Published - 2 Jul 2018 |
Event | 2018 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2018 - Perth, Australia Duration: 9 Dec 2018 → 13 Dec 2018 |
Publication series
Name | Conference on Optoelectronic and Microelectronic Materials and Devices |
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Publisher | IEEE |
ISSN (Print) | 1097-2137 |
Conference
Conference | 2018 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2018 |
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Country/Territory | Australia |
City | Perth |
Period | 9/12/18 → 13/12/18 |
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Dive into the research topics of 'Using thermography to investigate thermal characteristics of porous silicon'. Together they form a unique fingerprint.Projects
- 1 Finished
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A new technology platform for high speed, high sensitivity thermal imaging
Keating, A. (Investigator 01), Parish, G. (Investigator 02), Dell, J. (Investigator 03) & Andrews, G. (Investigator 04)
ARC Australian Research Council
1/01/17 → 30/04/20
Project: Research