Use of variogram analysis to classify field peas with and without internal defects caused by weevil infestation

Christian Nansen, Xuechen Zhang, Nader Aryamanesh, Guijun Yan

Research output: Contribution to journal › Article › peer-review

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@article{bcb069a04172476fb9aaad9f6b69444c,

title = "Use of variogram analysis to classify field peas with and without internal defects caused by weevil infestation",

author = "Christian Nansen and Xuechen Zhang and Nader Aryamanesh and Guijun Yan",

year = "2014",

doi = "10.1016/j.jfoodeng.2013.09.001",

language = "English",

volume = "123",

pages = "17 -- 24",

journal = "Journal of Food Engineering",

issn = "0260-8774",

publisher = "Elsevier",

}

TY - JOUR

T1 - Use of variogram analysis to classify field peas with and without internal defects caused by weevil infestation

AU - Nansen, Christian

AU - Zhang, Xuechen

AU - Aryamanesh, Nader

AU - Yan, Guijun

PY - 2014

Y1 - 2014

U2 - 10.1016/j.jfoodeng.2013.09.001

DO - 10.1016/j.jfoodeng.2013.09.001

M3 - Article

VL - 123

SP - 17

EP - 24

JO - Journal of Food Engineering

JF - Journal of Food Engineering

SN - 0260-8774

ER -