Use of variogram analysis to classify field peas with and without internal defects caused by weevil infestation

Christian Nansen, Xuechen Zhang, Nader Aryamanesh, Guijun Yan

Research output: Contribution to journalArticle

18 Citations (Scopus)
Original languageEnglish
Pages (from-to)17 - 24
JournalJournal of Food Engineering
Volume123
DOIs
Publication statusPublished - 2014

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