Transport measurements in silicon-on-insulator films: Comparison of Hall effect, mobility spectrum, and pseudo-metal-oxide-semiconductor-field-effect-transistor techniques

T.V. Chandrasekhar Rao, Jarek Antoszewski, Lorenzo Faraone, S. Cristoloveanu, T.H.M. Nguyen, P. Gentil, N. Bresson, F. Allibert

    Research output: Contribution to journal › Article › peer-review

    5 Citations (Scopus)
    783 Downloads (Pure)

    Fingerprint

    Dive into the research topics of 'Transport measurements in silicon-on-insulator films: Comparison of Hall effect, mobility spectrum, and pseudo-metal-oxide-semiconductor-field-effect-transistor techniques'. Together they form a unique fingerprint.

    Engineering

    Material Science