Towards a laser-beam-induced-current test structure for the nondestructive determination of junction depth in HgCdTe photodiodes

D.A. Redfern; W. Fang; Charles Musca; John Dell; Lorenzo Faraone

Towards a laser-beam-induced-current test structure for the nondestructive determination of junction depth in HgCdTe photodiodes

D.A. Redfern, W. Fang, Charles Musca, John Dell, Lorenzo Faraone

Graduate Research School

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000)
Editors	Leonard D. Broekman, Brian F. Usher, John D. Riley
Place of Publication	USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	169-172
Volume	1
Edition	La Trobe University, Melbourne
ISBN (Print)	0780366980
Publication status	Published - 2002
Event	Towards a laser-beam-induced-current test structure for the nondestructive determination of junction depth in HgCdTe photodiodes - La Trobe University, Melbourne Duration: 1 Jan 2002 → …

Conference

Conference	Towards a laser-beam-induced-current test structure for the nondestructive determination of junction depth in HgCdTe photodiodes
Period	1/01/02 → …

Cite this

Redfern, D. A., Fang, W., Musca, C., Dell, J., & Faraone, L. (2002). Towards a laser-beam-induced-current test structure for the nondestructive determination of junction depth in HgCdTe photodiodes. In L. D. Broekman, B. F. Usher, & J. D. Riley (Eds.), Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000) (La Trobe University, Melbourne ed., Vol. 1, pp. 169-172). IEEE, Institute of Electrical and Electronics Engineers.

Redfern, D.A. ; Fang, W. ; Musca, Charles ; Dell, John ; Faraone, Lorenzo. / Towards a laser-beam-induced-current test structure for the nondestructive determination of junction depth in HgCdTe photodiodes. Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000). editor / Leonard D. Broekman ; Brian F. Usher ; John D. Riley. Vol. 1 La Trobe University, Melbourne. ed. USA : IEEE, Institute of Electrical and Electronics Engineers, 2002. pp. 169-172

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title = "Towards a laser-beam-induced-current test structure for the nondestructive determination of junction depth in HgCdTe photodiodes",

author = "D.A. Redfern and W. Fang and Charles Musca and John Dell and Lorenzo Faraone",

year = "2002",

language = "English",

isbn = "0780366980",

volume = "1",

pages = "169--172",

editor = "Broekman, {Leonard D.} and Usher, {Brian F.} and Riley, {John D.}",

booktitle = "Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000)",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

edition = "La Trobe University, Melbourne",

note = "Towards a laser-beam-induced-current test structure for the nondestructive determination of junction depth in HgCdTe photodiodes ; Conference date: 01-01-2002",

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Redfern, DA, Fang, W, Musca, C, Dell, J & Faraone, L 2002, Towards a laser-beam-induced-current test structure for the nondestructive determination of junction depth in HgCdTe photodiodes. in LD Broekman, BF Usher & JD Riley (eds), Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000). La Trobe University, Melbourne edn, vol. 1, IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 169-172, Towards a laser-beam-induced-current test structure for the nondestructive determination of junction depth in HgCdTe photodiodes, 1/01/02.

Towards a laser-beam-induced-current test structure for the nondestructive determination of junction depth in HgCdTe photodiodes. / Redfern, D.A.; Fang, W.; Musca, Charles; Dell, John ; Faraone, Lorenzo.

Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000). ed. / Leonard D. Broekman; Brian F. Usher; John D. Riley. Vol. 1 La Trobe University, Melbourne. ed. USA : IEEE, Institute of Electrical and Electronics Engineers, 2002. p. 169-172.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - Towards a laser-beam-induced-current test structure for the nondestructive determination of junction depth in HgCdTe photodiodes

AU - Redfern, D.A.

AU - Fang, W.

AU - Musca, Charles

AU - Dell, John

AU - Faraone, Lorenzo

PY - 2002

Y1 - 2002

M3 - Conference paper

SN - 0780366980

VL - 1

SP - 169

EP - 172

BT - Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000)

A2 - Broekman, Leonard D.

A2 - Usher, Brian F.

A2 - Riley, John D.

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - USA

T2 - Towards a laser-beam-induced-current test structure for the nondestructive determination of junction depth in HgCdTe photodiodes

Y2 - 1 January 2002

ER -

Redfern DA, Fang W, Musca C, Dell J , Faraone L. Towards a laser-beam-induced-current test structure for the nondestructive determination of junction depth in HgCdTe photodiodes. In Broekman LD, Usher BF, Riley JD, editors, Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000). La Trobe University, Melbourne ed. Vol. 1. USA: IEEE, Institute of Electrical and Electronics Engineers. 2002. p. 169-172