Towards a laser-beam-induced-current test structure for the nondestructive determination of junction depth in HgCdTe photodiodes

D.A. Redfern, W. Fang, Charles Musca, John Dell, Lorenzo Faraone

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationProceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000)
EditorsLeonard D. Broekman, Brian F. Usher, John D. Riley
Place of PublicationUSA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages169-172
Volume1
EditionLa Trobe University, Melbourne
ISBN (Print)0780366980
Publication statusPublished - 2002
EventTowards a laser-beam-induced-current test structure for the nondestructive determination of junction depth in HgCdTe photodiodes - La Trobe University, Melbourne
Duration: 1 Jan 2002 → …

Conference

ConferenceTowards a laser-beam-induced-current test structure for the nondestructive determination of junction depth in HgCdTe photodiodes
Period1/01/02 → …

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