Thermal broadening of two-dimensional electron gas mobility distribution in AlGaN/AlN/GaN heterostructures

G. A. Umana-Membreno, T. Stomeob, V. Tasco, A. Passaseo, M. De Vittorio, L. Faraone

    Research output: Chapter in Book/Conference paperConference paper

    6 Citations (Scopus)

    Abstract

    Two-dimensional electron gas (2DEG) transport in Al0.3Ga0.7N/AlN/GaN heterostructures has been studied using magnetic-field dependent Hall-effect measurements and advanced mobility spectrum analysis techniques over the temperature range from 95 K to 300 K. It is shown that electronic transport is due to a single well-defined 2DEG species, with room-temperature sheet concentration and average mobility of 9.3×1012 cm-2 and 1,880 cm2/Vs, respectively. No parasitic conduction through the bulk GaN layer was detected. Importantly, it is shown that the 2DEG exhibits an approximately Gaussian mobility distribution, the linewidth of which broadens with increasing temperature. This is the first reported observation of thermal broadening effects in the 2DEG mobility distribution.

    Original languageEnglish
    Title of host publication2010 Proceedings of the European Solid State Device Research Conference, ESSDERC 2010
    Pages182-185
    Number of pages4
    DOIs
    Publication statusPublished - 15 Dec 2010
    Event2010 European Solid State Device Research Conference, ESSDERC 2010 - Sevilla, Spain
    Duration: 14 Sep 201016 Sep 2010

    Conference

    Conference2010 European Solid State Device Research Conference, ESSDERC 2010
    CountrySpain
    CitySevilla
    Period14/09/1016/09/10

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