The study of growth defects in sapphire by laser Rayleigh scattering imaging

Z. Yan; Li Ju; Slawomir Gras; C. Zhao; David Blair

doi:10.1088/1464-4258/6/6/020

The study of growth defects in sapphire by laser Rayleigh scattering imaging

Z. Yan, Li Ju, Slawomir Gras, C. Zhao, David Blair

Research output: Contribution to journal › Article

4 Citations (Scopus)

Abstract

We present the technique of laser Rayleigh scattering imaging (LRSI),which has been used for the mapping of inhomogeneities and point defectsin sapphire test masses for laser interferometer gravitational wave detectors.We analyse the errors associated with side wall mapping of cylindrical testmasses, and present the comparison of two samples which show significantdifferences. The technique could be used to improve quality control in themanufacture of optical materials.

Original language	English
Pages (from-to)	635-639
Journal	Journal of Optics A: Pure and Applied Optics
Volume	6
Issue number	6
DOIs	https://doi.org/10.1088/1464-4258/6/6/020
Publication status	Published - 2004

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title = "The study of growth defects in sapphire by laser Rayleigh scattering imaging",

abstract = "We present the technique of laser Rayleigh scattering imaging (LRSI),which has been used for the mapping of inhomogeneities and point defectsin sapphire test masses for laser interferometer gravitational wave detectors.We analyse the errors associated with side wall mapping of cylindrical testmasses, and present the comparison of two samples which show significantdifferences. The technique could be used to improve quality control in themanufacture of optical materials.",

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AU - Gras, Slawomir

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AU - Blair, David

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AB - We present the technique of laser Rayleigh scattering imaging (LRSI),which has been used for the mapping of inhomogeneities and point defectsin sapphire test masses for laser interferometer gravitational wave detectors.We analyse the errors associated with side wall mapping of cylindrical testmasses, and present the comparison of two samples which show significantdifferences. The technique could be used to improve quality control in themanufacture of optical materials.

U2 - 10.1088/1464-4258/6/6/020

DO - 10.1088/1464-4258/6/6/020

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JO - Journal of Optics A: Pure and Applied Optics

JF - Journal of Optics A: Pure and Applied Optics

SN - 1464-4258

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