The study of growth defects in sapphire by laser Rayleigh scattering imaging

Z. Yan, Li Ju, Slawomir Gras, C. Zhao, David Blair

    Research output: Contribution to journalArticle

    4 Citations (Scopus)

    Abstract

    We present the technique of laser Rayleigh scattering imaging (LRSI),which has been used for the mapping of inhomogeneities and point defectsin sapphire test masses for laser interferometer gravitational wave detectors.We analyse the errors associated with side wall mapping of cylindrical testmasses, and present the comparison of two samples which show significantdifferences. The technique could be used to improve quality control in themanufacture of optical materials.
    Original languageEnglish
    Pages (from-to)635-639
    JournalJournal of Optics A: Pure and Applied Optics
    Volume6
    Issue number6
    DOIs
    Publication statusPublished - 2004

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