The metrology system of the VLTI instrument GRAVITY

M. Lippa; S. Gillessen; N. Blind; Yitping Kok; A. Yazlcl; J. Weber; O. Pfuhl; M. Haug; S. Kellner; E. Wieprecht; F. Eisenhauer; R. Genzel; O. Hans; F. Haußmann; D. Huber; T. Kratschmann; T. Ott; M. Plattner; C. Rau; E. Sturm; I. Waisberg; E. Wiezorrek; G. Perrin; K. Perraut; W. Brandner; C. Straubmeier; A. Amorim

doi:10.1117/12.2232272

The metrology system of the VLTI instrument GRAVITY

M. Lippa, S. Gillessen, N. Blind, Yitping Kok, A. Yazlcl, J. Weber, O. Pfuhl, M. Haug, S. Kellner, E. Wieprecht, F. Eisenhauer, R. Genzel, O. Hans, F. Haußmann, D. Huber, T. Kratschmann, T. Ott, M. Plattner, C. Rau, E. SturmI. Waisberg, E. Wiezorrek, G. Perrin, K. Perraut, W. Brandner, C. Straubmeier, A. Amorim

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

11 Citations (Web of Science)

Abstract

© 2016 SPIE.The VLTI instrument GRAVITY combines the beams from four telescopes and provides phase-referenced imaging as well as precision-Astrometry of order 10 µas by observing two celestial objects in dual-field mode. Their angular separation can be determined from their differential OPD (dOPD) when the internal dOPDs in the interferometer are known. Here, we present the general overview of the novel metrology system which performs these measurements. The metrology consists of a three-beam laser system and a homodyne detection scheme for three-beam interference using phase-shifting interferometry in combination with lock-in amplifiers. Via this approach the metrology system measures dOPDs on a nanometer-level.

Original language	English
Title of host publication	Proceedings of SPIE
Subtitle of host publication	Optical and Infrared Interferometry and Imaging V
Editors	Michelle J. Creech-Eakman, Fabien Malbet, Peter G. Tuthill
Publisher	S P I E - International Society for Optical Engineering
Volume	9907
ISBN (Electronic)	9781510601932
ISBN (Print)	9781510601932
DOIs	https://doi.org/10.1117/12.2232272
Publication status	Published - 2016
Event	Optical and Infrared Interferometry and Imaging V - Edinburgh, United Kingdom Duration: 27 Jun 2016 → 1 Jul 2016

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	9907
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Optical and Infrared Interferometry and Imaging V
Country/Territory	United Kingdom
City	Edinburgh
Period	27/06/16 → 1/07/16

Access to Document

10.1117/12.2232272

Cite this

Lippa, M., Gillessen, S., Blind, N., Kok, Y., Yazlcl, A., Weber, J., Pfuhl, O., Haug, M., Kellner, S., Wieprecht, E., Eisenhauer, F., Genzel, R., Hans, O., Haußmann, F., Huber, D., Kratschmann, T., Ott, T., Plattner, M., Rau, C., ... Amorim, A. (2016). The metrology system of the VLTI instrument GRAVITY. In M. J. Creech-Eakman, F. Malbet, & P. G. Tuthill (Eds.), Proceedings of SPIE : Optical and Infrared Interferometry and Imaging V (Vol. 9907). Article 990722 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9907). S P I E - International Society for Optical Engineering. https://doi.org/10.1117/12.2232272

Lippa, M. ; Gillessen, S. ; Blind, N. et al. / The metrology system of the VLTI instrument GRAVITY. Proceedings of SPIE : Optical and Infrared Interferometry and Imaging V. editor / Michelle J. Creech-Eakman ; Fabien Malbet ; Peter G. Tuthill. Vol. 9907 S P I E - International Society for Optical Engineering, 2016. (Proceedings of SPIE - The International Society for Optical Engineering).

@inproceedings{e63c0c68190744abaf63bdd575f1acc5,

title = "The metrology system of the VLTI instrument GRAVITY",

abstract = "{\textcopyright} 2016 SPIE.The VLTI instrument GRAVITY combines the beams from four telescopes and provides phase-referenced imaging as well as precision-Astrometry of order 10 µas by observing two celestial objects in dual-field mode. Their angular separation can be determined from their differential OPD (dOPD) when the internal dOPDs in the interferometer are known. Here, we present the general overview of the novel metrology system which performs these measurements. The metrology consists of a three-beam laser system and a homodyne detection scheme for three-beam interference using phase-shifting interferometry in combination with lock-in amplifiers. Via this approach the metrology system measures dOPDs on a nanometer-level.",

author = "M. Lippa and S. Gillessen and N. Blind and Yitping Kok and A. Yazlcl and J. Weber and O. Pfuhl and M. Haug and S. Kellner and E. Wieprecht and F. Eisenhauer and R. Genzel and O. Hans and F. Hau{\ss}mann and D. Huber and T. Kratschmann and T. Ott and M. Plattner and C. Rau and E. Sturm and I. Waisberg and E. Wiezorrek and G. Perrin and K. Perraut and W. Brandner and C. Straubmeier and A. Amorim",

year = "2016",

doi = "10.1117/12.2232272",

language = "English",

isbn = "9781510601932",

volume = "9907",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "S P I E - International Society for Optical Engineering",

editor = "Creech-Eakman, {Michelle J.} and Fabien Malbet and Tuthill, {Peter G.}",

booktitle = "Proceedings of SPIE",

note = "Optical and Infrared Interferometry and Imaging V ; Conference date: 27-06-2016 Through 01-07-2016",

}

Lippa, M, Gillessen, S, Blind, N, Kok, Y, Yazlcl, A, Weber, J, Pfuhl, O, Haug, M, Kellner, S, Wieprecht, E, Eisenhauer, F, Genzel, R, Hans, O, Haußmann, F, Huber, D, Kratschmann, T, Ott, T, Plattner, M, Rau, C, Sturm, E, Waisberg, I, Wiezorrek, E, Perrin, G, Perraut, K, Brandner, W, Straubmeier, C & Amorim, A 2016, The metrology system of the VLTI instrument GRAVITY. in MJ Creech-Eakman, F Malbet & PG Tuthill (eds), Proceedings of SPIE : Optical and Infrared Interferometry and Imaging V. vol. 9907, 990722, Proceedings of SPIE - The International Society for Optical Engineering, vol. 9907, S P I E - International Society for Optical Engineering, Optical and Infrared Interferometry and Imaging V, Edinburgh, United Kingdom, 27/06/16. https://doi.org/10.1117/12.2232272

The metrology system of the VLTI instrument GRAVITY. / Lippa, M.; Gillessen, S.; Blind, N. et al.
Proceedings of SPIE : Optical and Infrared Interferometry and Imaging V. ed. / Michelle J. Creech-Eakman; Fabien Malbet; Peter G. Tuthill. Vol. 9907 S P I E - International Society for Optical Engineering, 2016. 990722 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9907).

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

TY - GEN

T1 - The metrology system of the VLTI instrument GRAVITY

AU - Lippa, M.

AU - Gillessen, S.

AU - Blind, N.

AU - Kok, Yitping

AU - Yazlcl, A.

AU - Weber, J.

AU - Pfuhl, O.

AU - Haug, M.

AU - Kellner, S.

AU - Wieprecht, E.

AU - Eisenhauer, F.

AU - Genzel, R.

AU - Hans, O.

AU - Haußmann, F.

AU - Huber, D.

AU - Kratschmann, T.

AU - Ott, T.

AU - Plattner, M.

AU - Rau, C.

AU - Sturm, E.

AU - Waisberg, I.

AU - Wiezorrek, E.

AU - Perrin, G.

AU - Perraut, K.

AU - Brandner, W.

AU - Straubmeier, C.

AU - Amorim, A.

PY - 2016

Y1 - 2016

N2 - © 2016 SPIE.The VLTI instrument GRAVITY combines the beams from four telescopes and provides phase-referenced imaging as well as precision-Astrometry of order 10 µas by observing two celestial objects in dual-field mode. Their angular separation can be determined from their differential OPD (dOPD) when the internal dOPDs in the interferometer are known. Here, we present the general overview of the novel metrology system which performs these measurements. The metrology consists of a three-beam laser system and a homodyne detection scheme for three-beam interference using phase-shifting interferometry in combination with lock-in amplifiers. Via this approach the metrology system measures dOPDs on a nanometer-level.

AB - © 2016 SPIE.The VLTI instrument GRAVITY combines the beams from four telescopes and provides phase-referenced imaging as well as precision-Astrometry of order 10 µas by observing two celestial objects in dual-field mode. Their angular separation can be determined from their differential OPD (dOPD) when the internal dOPDs in the interferometer are known. Here, we present the general overview of the novel metrology system which performs these measurements. The metrology consists of a three-beam laser system and a homodyne detection scheme for three-beam interference using phase-shifting interferometry in combination with lock-in amplifiers. Via this approach the metrology system measures dOPDs on a nanometer-level.

U2 - 10.1117/12.2232272

DO - 10.1117/12.2232272

M3 - Conference paper

SN - 9781510601932

VL - 9907

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Proceedings of SPIE

A2 - Creech-Eakman, Michelle J.

A2 - Malbet, Fabien

A2 - Tuthill, Peter G.

PB - S P I E - International Society for Optical Engineering

T2 - Optical and Infrared Interferometry and Imaging V

Y2 - 27 June 2016 through 1 July 2016

ER -

Lippa M, Gillessen S, Blind N, Kok Y, Yazlcl A, Weber J et al. The metrology system of the VLTI instrument GRAVITY. In Creech-Eakman MJ, Malbet F, Tuthill PG, editors, Proceedings of SPIE : Optical and Infrared Interferometry and Imaging V. Vol. 9907. S P I E - International Society for Optical Engineering. 2016. 990722. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2232272

The metrology system of the VLTI instrument GRAVITY

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