The Measurement of the Dielectric Loss Tangent of Alumina at Microwave Frequencies and Room Temperature

R.A. Woode; Eugene Ivanov; M.E. Tobar; David Blair

doi:10.1049/el:19941470

The Measurement of the Dielectric Loss Tangent of Alumina at Microwave Frequencies and Room Temperature

R.A. Woode, Eugene Ivanov, M.E. Tobar, David Blair

Graduate Research School

Research output: Contribution to journal › Article › peer-review

22 Citations (Scopus)

Abstract

The use of whispering gallery modes allows the dielectric loss tangent of polycrystalline Al2O3 (alumina) to be accurately determined at microwave frequencies without the use of a cavity. The dielectric loss tangent of alumina is shown to be strongly variable from sample to sample with a lowest measured value of 4.3 x 10(-5) observed at 9.0 GHz in a 99.5% alumina sample.

Original language	English
Pages (from-to)	2120-2122
Journal	Electronics Letters
Volume	30
Issue number	25
DOIs	https://doi.org/10.1049/el:19941470
Publication status	Published - 1994

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title = "The Measurement of the Dielectric Loss Tangent of Alumina at Microwave Frequencies and Room Temperature",

abstract = "The use of whispering gallery modes allows the dielectric loss tangent of polycrystalline Al2O3 (alumina) to be accurately determined at microwave frequencies without the use of a cavity. The dielectric loss tangent of alumina is shown to be strongly variable from sample to sample with a lowest measured value of 4.3 x 10(-5) observed at 9.0 GHz in a 99.5% alumina sample.",

author = "R.A. Woode and Eugene Ivanov and M.E. Tobar and David Blair",

year = "1994",

doi = "10.1049/el:19941470",

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journal = "Electronics Letters",

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T1 - The Measurement of the Dielectric Loss Tangent of Alumina at Microwave Frequencies and Room Temperature

AU - Woode, R.A.

AU - Ivanov, Eugene

AU - Tobar, M.E.

AU - Blair, David

PY - 1994

Y1 - 1994

N2 - The use of whispering gallery modes allows the dielectric loss tangent of polycrystalline Al2O3 (alumina) to be accurately determined at microwave frequencies without the use of a cavity. The dielectric loss tangent of alumina is shown to be strongly variable from sample to sample with a lowest measured value of 4.3 x 10(-5) observed at 9.0 GHz in a 99.5% alumina sample.

AB - The use of whispering gallery modes allows the dielectric loss tangent of polycrystalline Al2O3 (alumina) to be accurately determined at microwave frequencies without the use of a cavity. The dielectric loss tangent of alumina is shown to be strongly variable from sample to sample with a lowest measured value of 4.3 x 10(-5) observed at 9.0 GHz in a 99.5% alumina sample.

U2 - 10.1049/el:19941470

DO - 10.1049/el:19941470

M3 - Article

VL - 30

SP - 2120

EP - 2122

JO - Electronics Letters

JF - Electronics Letters

IS - 25

ER -

The Measurement of the Dielectric Loss Tangent of Alumina at Microwave Frequencies and Room Temperature

Abstract

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