The Measurement of the Dielectric Loss Tangent of Alumina at Microwave Frequencies and Room Temperature

R.A. Woode, Eugene Ivanov, M.E. Tobar, David Blair

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

The use of whispering gallery modes allows the dielectric loss tangent of polycrystalline Al2O3 (alumina) to be accurately determined at microwave frequencies without the use of a cavity. The dielectric loss tangent of alumina is shown to be strongly variable from sample to sample with a lowest measured value of 4.3 x 10(-5) observed at 9.0 GHz in a 99.5% alumina sample.
Original languageEnglish
Pages (from-to)2120-2122
JournalElectronics Letters
Volume30
Issue number25
DOIs
Publication statusPublished - 1994

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