Abstract
The use of whispering gallery modes allows the dielectric loss tangent of polycrystalline Al2O3 (alumina) to be accurately determined at microwave frequencies without the use of a cavity. The dielectric loss tangent of alumina is shown to be strongly variable from sample to sample with a lowest measured value of 4.3 x 10(-5) observed at 9.0 GHz in a 99.5% alumina sample.
Original language | English |
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Pages (from-to) | 2120-2122 |
Journal | Electronics Letters |
Volume | 30 |
Issue number | 25 |
DOIs | |
Publication status | Published - 1994 |