Original language | English |
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Title of host publication | Proceedings of the IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC'03 |
Pages | 633-636 |
Number of pages | 4 |
Volume | 1 |
Publication status | Published - 2003 |
The influence of slot position on the shielding degradation of metallic enclosures
F Schlagenhaufer, J He, K Fynn, Antonio Cantoni
Research output: Chapter in Book/Conference paper › Conference paper › peer-review