TY - JOUR
T1 - The Effect of Interactions between Item Discrimination and Item Difficulty on Fit Statistics
AU - Humphry, Stephen
AU - Bredemeyer, Ken
PY - 2020
Y1 - 2020
N2 - Residual-based fit statistics are among the most common indicators of fit to the Rasch model. There is considerable discussion in the literature of the efficacy of item fit statistics in detecting measurement disturbances. However, to date there has been no investigation of whether these fit statistics are robust to interactions between item discrimination and item difficulty. This study uses simulations to investigate whether interaction effects occur for fit statistics commonly used with the Rasch model. It is found that when the parameters are estimated with the Rasch model, the values of certain item fit statistics vary depending on the interaction between location and discrimination. Specifically, in the study, OUTFIT MNSQ and INFIT MNSQ provide a relatively consistent index of item discrimination across a range of item difficulties, whereas the t-statistic and the log transformed fit residual vary in a systematic fashion that depends on item location.
AB - Residual-based fit statistics are among the most common indicators of fit to the Rasch model. There is considerable discussion in the literature of the efficacy of item fit statistics in detecting measurement disturbances. However, to date there has been no investigation of whether these fit statistics are robust to interactions between item discrimination and item difficulty. This study uses simulations to investigate whether interaction effects occur for fit statistics commonly used with the Rasch model. It is found that when the parameters are estimated with the Rasch model, the values of certain item fit statistics vary depending on the interaction between location and discrimination. Specifically, in the study, OUTFIT MNSQ and INFIT MNSQ provide a relatively consistent index of item discrimination across a range of item difficulties, whereas the t-statistic and the log transformed fit residual vary in a systematic fashion that depends on item location.
KW - Rasch measurement
KW - psychometrics
KW - model fit
KW - educational measurement
UR - https://pubmed.ncbi.nlm.nih.gov/33989196/
M3 - Article
C2 - 33989196
SN - 1529-7713
VL - 21
SP - 377
EP - 399
JO - Journal of Applied Measurement
JF - Journal of Applied Measurement
IS - 4
ER -