The Dependence of Phonon and Paramagnetic Resonances on the Fine Structure Constant in Sapphire and the Possibility of a Test of Time Depedence

Michael Tobar; John Hartnett

The Dependence of Phonon and Paramagnetic Resonances on the Fine Structure Constant in Sapphire and the Possibility of a Test of Time Depedence

Graduate Research School

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition, Jointly with the 17th Europea
Editors	R.J. Vig
Place of Publication	USa
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	211-216a
Volume	N/A
Edition	Florida, USA
ISBN (Print)	0780376889
Publication status	Published - 2003
Event	The Dependence of Phonon and Paramagnetic Resonances on the Fine Structure Constant in Sapphire and the Possibility of a Test of Time Depedence - Florida, USA Duration: 1 Jan 2003 → …

Conference

Conference	The Dependence of Phonon and Paramagnetic Resonances on the Fine Structure Constant in Sapphire and the Possibility of a Test of Time Depedence
Period	1/01/03 → …

Cite this

Tobar, M., & Hartnett, J. (2003). The Dependence of Phonon and Paramagnetic Resonances on the Fine Structure Constant in Sapphire and the Possibility of a Test of Time Depedence. In R. J. Vig (Ed.), Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition, Jointly with the 17th Europea (Florida, USA ed., Vol. N/A, pp. 211-216a). IEEE, Institute of Electrical and Electronics Engineers.

Tobar, Michael ; Hartnett, John. / The Dependence of Phonon and Paramagnetic Resonances on the Fine Structure Constant in Sapphire and the Possibility of a Test of Time Depedence. Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition, Jointly with the 17th Europea. editor / R.J. Vig. Vol. N/A Florida, USA. ed. USa : IEEE, Institute of Electrical and Electronics Engineers, 2003. pp. 211-216a

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booktitle = "Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition, Jointly with the 17th Europea",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

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Tobar, M & Hartnett, J 2003, The Dependence of Phonon and Paramagnetic Resonances on the Fine Structure Constant in Sapphire and the Possibility of a Test of Time Depedence. in RJ Vig (ed.), Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition, Jointly with the 17th Europea. Florida, USA edn, vol. N/A, IEEE, Institute of Electrical and Electronics Engineers, USa, pp. 211-216a, The Dependence of Phonon and Paramagnetic Resonances on the Fine Structure Constant in Sapphire and the Possibility of a Test of Time Depedence, 1/01/03.

The Dependence of Phonon and Paramagnetic Resonances on the Fine Structure Constant in Sapphire and the Possibility of a Test of Time Depedence. / Tobar, Michael; Hartnett, John.
Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition, Jointly with the 17th Europea. ed. / R.J. Vig. Vol. N/A Florida, USA. ed. USa: IEEE, Institute of Electrical and Electronics Engineers, 2003. p. 211-216a.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - The Dependence of Phonon and Paramagnetic Resonances on the Fine Structure Constant in Sapphire and the Possibility of a Test of Time Depedence

AU - Tobar, Michael

AU - Hartnett, John

PY - 2003

Y1 - 2003

M3 - Conference paper

SN - 0780376889

VL - N/A

SP - 211-216a

BT - Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition, Jointly with the 17th Europea

A2 - Vig, R.J.

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - USa

T2 - The Dependence of Phonon and Paramagnetic Resonances on the Fine Structure Constant in Sapphire and the Possibility of a Test of Time Depedence

Y2 - 1 January 2003

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Tobar M, Hartnett J. The Dependence of Phonon and Paramagnetic Resonances on the Fine Structure Constant in Sapphire and the Possibility of a Test of Time Depedence. In Vig RJ, editor, Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition, Jointly with the 17th Europea. Florida, USA ed. Vol. N/A. USa: IEEE, Institute of Electrical and Electronics Engineers. 2003. p. 211-216a