Testing Lorentz invariance using rotating cryogenic sapphire oscillators

Stephen R. Parker; M. Nagel; E. Kovalchuk; Paul L. Stanwix; Eugene N. Ivanov; John G. Hartnett; A. Peters; Michael E. Tobar

Testing Lorentz invariance using rotating cryogenic sapphire oscillators

Stephen R. Parker, M. Nagel, E. Kovalchuk, Paul L. Stanwix, Eugene N. Ivanov, John G. Hartnett, A. Peters, Michael E. Tobar

Research output: Contribution to conference › Abstract › peer-review

Abstract

A cryogenic sapphire oscillator exploits the remarkable properties of sapphire dielectric at low temperatures to generate a microwave frequency signal with a fractional frequency stability of parts in 10−16 for integration times on the order of hundreds of seconds. We describe an experimental test of Lorentz invariance in electrodynamics that searches for orientation dependent deviations in the speed of light by comparing the frequencies of two actively rotated orthogonally aligned cryogenic sapphire oscillators. Data has been collected for over one year allowing us to set the most stringent laboratory bound on the isotropy of the speed of light and constrain multiple Lorentz violating parameters of a Standard Model extension framework.

Original language	English
Publication status	Published - 2014
Event	APR14 Meeting of The American Physical Society - Savannah, United States Duration: 5 Apr 2014 → 8 Apr 2014

Conference

Conference	APR14 Meeting of The American Physical Society
Country/Territory	United States
City	Savannah
Period	5/04/14 → 8/04/14

Access to Document

http://meetings.aps.org/Meeting/APR14/Session/R14.2

Cite this

@conference{d0f0f1dd1dfd443889c45826a0b7f1a0,

title = "Testing Lorentz invariance using rotating cryogenic sapphire oscillators",

abstract = "A cryogenic sapphire oscillator exploits the remarkable properties of sapphire dielectric at low temperatures to generate a microwave frequency signal with a fractional frequency stability of parts in 10−16 for integration times on the order of hundreds of seconds. We describe an experimental test of Lorentz invariance in electrodynamics that searches for orientation dependent deviations in the speed of light by comparing the frequencies of two actively rotated orthogonally aligned cryogenic sapphire oscillators. Data has been collected for over one year allowing us to set the most stringent laboratory bound on the isotropy of the speed of light and constrain multiple Lorentz violating parameters of a Standard Model extension framework.",

author = "Parker, {Stephen R.} and M. Nagel and E. Kovalchuk and Stanwix, {Paul L.} and Ivanov, {Eugene N.} and Hartnett, {John G.} and A. Peters and Tobar, {Michael E.}",

year = "2014",

language = "English",

note = "APR14 Meeting of The American Physical Society ; Conference date: 05-04-2014 Through 08-04-2014",

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TY - CONF

T1 - Testing Lorentz invariance using rotating cryogenic sapphire oscillators

AU - Parker, Stephen R.

AU - Nagel, M.

AU - Kovalchuk, E.

AU - Stanwix, Paul L.

AU - Ivanov, Eugene N.

AU - Hartnett, John G.

AU - Peters, A.

AU - Tobar, Michael E.

PY - 2014

Y1 - 2014

N2 - A cryogenic sapphire oscillator exploits the remarkable properties of sapphire dielectric at low temperatures to generate a microwave frequency signal with a fractional frequency stability of parts in 10−16 for integration times on the order of hundreds of seconds. We describe an experimental test of Lorentz invariance in electrodynamics that searches for orientation dependent deviations in the speed of light by comparing the frequencies of two actively rotated orthogonally aligned cryogenic sapphire oscillators. Data has been collected for over one year allowing us to set the most stringent laboratory bound on the isotropy of the speed of light and constrain multiple Lorentz violating parameters of a Standard Model extension framework.

AB - A cryogenic sapphire oscillator exploits the remarkable properties of sapphire dielectric at low temperatures to generate a microwave frequency signal with a fractional frequency stability of parts in 10−16 for integration times on the order of hundreds of seconds. We describe an experimental test of Lorentz invariance in electrodynamics that searches for orientation dependent deviations in the speed of light by comparing the frequencies of two actively rotated orthogonally aligned cryogenic sapphire oscillators. Data has been collected for over one year allowing us to set the most stringent laboratory bound on the isotropy of the speed of light and constrain multiple Lorentz violating parameters of a Standard Model extension framework.

M3 - Abstract

T2 - APR14 Meeting of The American Physical Society

Y2 - 5 April 2014 through 8 April 2014

ER -

Testing Lorentz invariance using rotating cryogenic sapphire oscillators

Abstract

Conference

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