Testing Lorentz invariance using rotating cryogenic sapphire oscillators

Stephen R. Parker, M. Nagel, E. Kovalchuk, Paul L. Stanwix, Eugene N. Ivanov, John G. Hartnett, A. Peters, Michael E. Tobar

    Research output: Contribution to conferenceAbstract

    Abstract

    A cryogenic sapphire oscillator exploits the remarkable properties of sapphire dielectric at low temperatures to generate a microwave frequency signal with a fractional frequency stability of parts in 10−16 for integration times on the order of hundreds of seconds. We describe an experimental test of Lorentz invariance in electrodynamics that searches for orientation dependent deviations in the speed of light by comparing the frequencies of two actively rotated orthogonally aligned cryogenic sapphire oscillators. Data has been collected for over one year allowing us to set the most stringent laboratory bound on the isotropy of the speed of light and constrain multiple Lorentz violating parameters of a Standard Model extension framework.
    Original languageEnglish
    Publication statusPublished - 2014
    EventAPR14 Meeting of The American Physical Society - Savannah, United States
    Duration: 5 Apr 20148 Apr 2014

    Conference

    ConferenceAPR14 Meeting of The American Physical Society
    CountryUnited States
    CitySavannah
    Period5/04/148/04/14

    Fingerprint

    cryogenics
    invariance
    sapphire
    oscillators
    frequency stability
    isotropy
    microwave frequencies
    electrodynamics
    deviation

    Cite this

    Parker, S. R., Nagel, M., Kovalchuk, E., Stanwix, P. L., Ivanov, E. N., Hartnett, J. G., ... Tobar, M. E. (2014). Testing Lorentz invariance using rotating cryogenic sapphire oscillators. Abstract from APR14 Meeting of The American Physical Society, Savannah, United States.
    Parker, Stephen R. ; Nagel, M. ; Kovalchuk, E. ; Stanwix, Paul L. ; Ivanov, Eugene N. ; Hartnett, John G. ; Peters, A. ; Tobar, Michael E. / Testing Lorentz invariance using rotating cryogenic sapphire oscillators. Abstract from APR14 Meeting of The American Physical Society, Savannah, United States.
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    title = "Testing Lorentz invariance using rotating cryogenic sapphire oscillators",
    abstract = "A cryogenic sapphire oscillator exploits the remarkable properties of sapphire dielectric at low temperatures to generate a microwave frequency signal with a fractional frequency stability of parts in 10−16 for integration times on the order of hundreds of seconds. We describe an experimental test of Lorentz invariance in electrodynamics that searches for orientation dependent deviations in the speed of light by comparing the frequencies of two actively rotated orthogonally aligned cryogenic sapphire oscillators. Data has been collected for over one year allowing us to set the most stringent laboratory bound on the isotropy of the speed of light and constrain multiple Lorentz violating parameters of a Standard Model extension framework.",
    author = "Parker, {Stephen R.} and M. Nagel and E. Kovalchuk and Stanwix, {Paul L.} and Ivanov, {Eugene N.} and Hartnett, {John G.} and A. Peters and Tobar, {Michael E.}",
    year = "2014",
    language = "English",
    note = "APR14 Meeting of The American Physical Society ; Conference date: 05-04-2014 Through 08-04-2014",

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    Parker, SR, Nagel, M, Kovalchuk, E, Stanwix, PL, Ivanov, EN, Hartnett, JG, Peters, A & Tobar, ME 2014, 'Testing Lorentz invariance using rotating cryogenic sapphire oscillators' APR14 Meeting of The American Physical Society, Savannah, United States, 5/04/14 - 8/04/14, .

    Testing Lorentz invariance using rotating cryogenic sapphire oscillators. / Parker, Stephen R.; Nagel, M.; Kovalchuk, E.; Stanwix, Paul L.; Ivanov, Eugene N.; Hartnett, John G.; Peters, A.; Tobar, Michael E.

    2014. Abstract from APR14 Meeting of The American Physical Society, Savannah, United States.

    Research output: Contribution to conferenceAbstract

    TY - CONF

    T1 - Testing Lorentz invariance using rotating cryogenic sapphire oscillators

    AU - Parker, Stephen R.

    AU - Nagel, M.

    AU - Kovalchuk, E.

    AU - Stanwix, Paul L.

    AU - Ivanov, Eugene N.

    AU - Hartnett, John G.

    AU - Peters, A.

    AU - Tobar, Michael E.

    PY - 2014

    Y1 - 2014

    N2 - A cryogenic sapphire oscillator exploits the remarkable properties of sapphire dielectric at low temperatures to generate a microwave frequency signal with a fractional frequency stability of parts in 10−16 for integration times on the order of hundreds of seconds. We describe an experimental test of Lorentz invariance in electrodynamics that searches for orientation dependent deviations in the speed of light by comparing the frequencies of two actively rotated orthogonally aligned cryogenic sapphire oscillators. Data has been collected for over one year allowing us to set the most stringent laboratory bound on the isotropy of the speed of light and constrain multiple Lorentz violating parameters of a Standard Model extension framework.

    AB - A cryogenic sapphire oscillator exploits the remarkable properties of sapphire dielectric at low temperatures to generate a microwave frequency signal with a fractional frequency stability of parts in 10−16 for integration times on the order of hundreds of seconds. We describe an experimental test of Lorentz invariance in electrodynamics that searches for orientation dependent deviations in the speed of light by comparing the frequencies of two actively rotated orthogonally aligned cryogenic sapphire oscillators. Data has been collected for over one year allowing us to set the most stringent laboratory bound on the isotropy of the speed of light and constrain multiple Lorentz violating parameters of a Standard Model extension framework.

    M3 - Abstract

    ER -

    Parker SR, Nagel M, Kovalchuk E, Stanwix PL, Ivanov EN, Hartnett JG et al. Testing Lorentz invariance using rotating cryogenic sapphire oscillators. 2014. Abstract from APR14 Meeting of The American Physical Society, Savannah, United States.