Temperature stability of HgCdTe n-on-p junctions formed by reactive ion etching

J.K. White, Jarek Antoszewski, Charles Musca, John Dell, Lorenzo Faraone, P. Burke

Research output: Chapter in Book/Conference paperConference paperpeer-review

Original languageEnglish
Title of host publicationProceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000)
EditorsLeonard D. Broekman, Brian F. Usher, John D. Riley
Place of PublicationUSA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages81-84
Volume1
EditionLa Trobe University, Melbourne
ISBN (Print)0780366980
Publication statusPublished - 2002
EventTemperature stability of HgCdTe n-on-p junctions formed by reactive ion etching - La Trobe University, Melbourne
Duration: 1 Jan 2002 → …

Conference

ConferenceTemperature stability of HgCdTe n-on-p junctions formed by reactive ion etching
Period1/01/02 → …

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