Synchrotron X-ray Measurement of Diffracted Intensities from Single Crystal by a Detector using Stacked Avalanche Photodiodes

N. Ishizawa; S. Kishimoto; T.P. Vaalsta

Synchrotron X-ray Measurement of Diffracted Intensities from Single Crystal by a Detector using Stacked Avalanche Photodiodes

N. Ishizawa, S. Kishimoto, T.P. Vaalsta

Graduate Research School

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	SAGAMORE XII
Editors	B.E. Robertson
Place of Publication	Saskatchewan, Canada
Publisher	University of Regina
Pages	PA96
Volume	n/a
Edition	Saskatchewan, Canada
Publication status	Published - 1997
Event	Synchrotron X-ray Measurement of Diffracted Intensities from Single Crystal by a Detector using Stacked Avalanche Photodiodes - Saskatchewan, Canada Duration: 1 Jan 1997 → …

Conference

Conference	Synchrotron X-ray Measurement of Diffracted Intensities from Single Crystal by a Detector using Stacked Avalanche Photodiodes
Period	1/01/97 → …

Cite this

@inproceedings{92dd79eb8eda408ab072601e31787e3c,

title = "Synchrotron X-ray Measurement of Diffracted Intensities from Single Crystal by a Detector using Stacked Avalanche Photodiodes",

author = "N. Ishizawa and S. Kishimoto and T.P. Vaalsta",

year = "1997",

language = "English",

volume = "n/a",

pages = "PA96",

editor = "B.E. Robertson",

booktitle = "SAGAMORE XII",

publisher = "University of Regina",

edition = "Saskatchewan, Canada",

note = "Synchrotron X-ray Measurement of Diffracted Intensities from Single Crystal by a Detector using Stacked Avalanche Photodiodes ; Conference date: 01-01-1997",

}

Ishizawa, N, Kishimoto, S & Vaalsta, TP 1997, Synchrotron X-ray Measurement of Diffracted Intensities from Single Crystal by a Detector using Stacked Avalanche Photodiodes. in BE Robertson (ed.), SAGAMORE XII. Saskatchewan, Canada edn, vol. n/a, University of Regina, Saskatchewan, Canada, pp. PA96, Synchrotron X-ray Measurement of Diffracted Intensities from Single Crystal by a Detector using Stacked Avalanche Photodiodes, 1/01/97.

Synchrotron X-ray Measurement of Diffracted Intensities from Single Crystal by a Detector using Stacked Avalanche Photodiodes. / Ishizawa, N.; Kishimoto, S.; Vaalsta, T.P.
SAGAMORE XII. ed. / B.E. Robertson. Vol. n/a Saskatchewan, Canada. ed. Saskatchewan, Canada: University of Regina, 1997. p. PA96.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - Synchrotron X-ray Measurement of Diffracted Intensities from Single Crystal by a Detector using Stacked Avalanche Photodiodes

AU - Ishizawa, N.

AU - Kishimoto, S.

AU - Vaalsta, T.P.

PY - 1997

Y1 - 1997

M3 - Conference paper

VL - n/a

SP - PA96

BT - SAGAMORE XII

A2 - Robertson, B.E.

PB - University of Regina

CY - Saskatchewan, Canada

T2 - Synchrotron X-ray Measurement of Diffracted Intensities from Single Crystal by a Detector using Stacked Avalanche Photodiodes

Y2 - 1 January 1997

ER -