Subsurface charge effects in insulators observed directly in the environmental scanning electron microscope (ESEM) - implications for electron imaging and x-ray microanalysis

Brendan Griffin, C.E. Nockolds

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationAustralian X-ray Analytical Association Inc. (WA) and Western Australian Society for Electron Microscopy
EditorsH. Fairhurst
Place of PublicationPerth
PublisherAlcoa
Pages7-8
Volume1
EditionPemberton
ISBN (Print)0 646 29450 4
Publication statusPublished - 1996
EventSubsurface charge effects in insulators observed directly in the environmental scanning electron microscope (ESEM) - implications for electron imaging and x-ray microanalysis - Pemberton
Duration: 1 Jan 1996 → …

Conference

ConferenceSubsurface charge effects in insulators observed directly in the environmental scanning electron microscope (ESEM) - implications for electron imaging and x-ray microanalysis
Period1/01/96 → …

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