Structural and Optical Characterisation of (001) HgTe-Hg1-xCdxTe Superlattices Grown by Molecular Beam Epitaxy

S.D. Hatch, C.R. Becker, Martin Saunders, Richard Sewell, T. Dieing, John Dell, Robert Stamps

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publication2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings
EditorsAleksandar D. Raki&#263, Yew Tong Yeow
Place of PublicationUnited States
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages65-68
VolumeNot applicable
EditionBrisbane, Australia
ISBN (Print)0780388208
Publication statusPublished - 2005
EventStructural and Optical Characterisation of (001) HgTe-Hg1-xCdxTe Superlattices Grown by Molecular Beam Epitaxy - Brisbane, Australia
Duration: 1 Jan 2005 → …

Conference

ConferenceStructural and Optical Characterisation of (001) HgTe-Hg1-xCdxTe Superlattices Grown by Molecular Beam Epitaxy
Period1/01/05 → …

Cite this

Hatch, S. D., Becker, C. R., Saunders, M., Sewell, R., Dieing, T., Dell, J., & Stamps, R. (2005). Structural and Optical Characterisation of (001) HgTe-Hg1-xCdxTe Superlattices Grown by Molecular Beam Epitaxy. In A. D. Raki&#263, & Y. T. Yeow (Eds.), 2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings (Brisbane, Australia ed., Vol. Not applicable, pp. 65-68). IEEE, Institute of Electrical and Electronics Engineers.