Structural and Optical Characterisation of (001) HgTe-Hg1-xCdxTe Superlattices Grown by Molecular Beam Epitaxy

S.D. Hatch; C.R. Becker; Martin Saunders; Richard Sewell; T. Dieing; John Dell; Robert Stamps

Structural and Optical Characterisation of (001) HgTe-Hg1-xCdxTe Superlattices Grown by Molecular Beam Epitaxy

S.D. Hatch, C.R. Becker, Martin Saunders, Richard Sewell, T. Dieing, John Dell, Robert Stamps

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings
Editors	Aleksandar D. Raki&#263, Yew Tong Yeow
Place of Publication	United States
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	65-68
Volume	Not applicable
Edition	Brisbane, Australia
ISBN (Print)	0780388208
Publication status	Published - 2005
Event	Structural and Optical Characterisation of (001) HgTe-Hg1-xCdxTe Superlattices Grown by Molecular Beam Epitaxy - Brisbane, Australia Duration: 1 Jan 2005 → …

Conference

Conference	Structural and Optical Characterisation of (001) HgTe-Hg1-xCdxTe Superlattices Grown by Molecular Beam Epitaxy
Period	1/01/05 → …

Cite this

Hatch, S. D., Becker, C. R., Saunders, M., Sewell, R., Dieing, T., Dell, J., & Stamps, R. (2005). Structural and Optical Characterisation of (001) HgTe-Hg1-xCdxTe Superlattices Grown by Molecular Beam Epitaxy. In A. D. Raki&#263, & Y. T. Yeow (Eds.), 2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings (Brisbane, Australia ed., Vol. Not applicable, pp. 65-68). IEEE, Institute of Electrical and Electronics Engineers.

Hatch, S.D. ; Becker, C.R. ; Saunders, Martin et al. / Structural and Optical Characterisation of (001) HgTe-Hg1-xCdxTe Superlattices Grown by Molecular Beam Epitaxy. 2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings. editor / Aleksandar D. Raki&#263 ; Yew Tong Yeow. Vol. Not applicable Brisbane, Australia. ed. United States : IEEE, Institute of Electrical and Electronics Engineers, 2005. pp. 65-68

@inproceedings{b3ffa304a48f4b9984a69578b1a0a2b7,

title = "Structural and Optical Characterisation of (001) HgTe-Hg1-xCdxTe Superlattices Grown by Molecular Beam Epitaxy",

author = "S.D. Hatch and C.R. Becker and Martin Saunders and Richard Sewell and T. Dieing and John Dell and Robert Stamps",

year = "2005",

language = "English",

isbn = "0780388208",

volume = "Not applicable",

pages = "65--68",

editor = "Raki&#263, {Aleksandar D.} and Yeow, {Yew Tong}",

booktitle = "2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

edition = "Brisbane, Australia",

note = "Structural and Optical Characterisation of (001) HgTe-Hg1-xCdxTe Superlattices Grown by Molecular Beam Epitaxy ; Conference date: 01-01-2005",

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Hatch, SD, Becker, CR, Saunders, M, Sewell, R, Dieing, T, Dell, J & Stamps, R 2005, Structural and Optical Characterisation of (001) HgTe-Hg1-xCdxTe Superlattices Grown by Molecular Beam Epitaxy. in AD Raki&#263 & YT Yeow (eds), 2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings. Brisbane, Australia edn, vol. Not applicable, IEEE, Institute of Electrical and Electronics Engineers, United States, pp. 65-68, Structural and Optical Characterisation of (001) HgTe-Hg1-xCdxTe Superlattices Grown by Molecular Beam Epitaxy, 1/01/05.

Structural and Optical Characterisation of (001) HgTe-Hg1-xCdxTe Superlattices Grown by Molecular Beam Epitaxy. / Hatch, S.D.; Becker, C.R.; Saunders, Martin et al.
2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings. ed. / Aleksandar D. Rakić Yew Tong Yeow. Vol. Not applicable Brisbane, Australia. ed. United States: IEEE, Institute of Electrical and Electronics Engineers, 2005. p. 65-68.

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

TY - GEN

T1 - Structural and Optical Characterisation of (001) HgTe-Hg1-xCdxTe Superlattices Grown by Molecular Beam Epitaxy

AU - Hatch, S.D.

AU - Becker, C.R.

AU - Saunders, Martin

AU - Sewell, Richard

AU - Dieing, T.

AU - Dell, John

AU - Stamps, Robert

PY - 2005

Y1 - 2005

M3 - Conference paper

SN - 0780388208

VL - Not applicable

SP - 65

EP - 68

BT - 2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings

A2 - Raki&#263, Aleksandar D.

A2 - Yeow, Yew Tong

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - United States

T2 - Structural and Optical Characterisation of (001) HgTe-Hg1-xCdxTe Superlattices Grown by Molecular Beam Epitaxy

Y2 - 1 January 2005

ER -

Hatch SD, Becker CR, Saunders M, Sewell R, Dieing T, Dell J et al. Structural and Optical Characterisation of (001) HgTe-Hg1-xCdxTe Superlattices Grown by Molecular Beam Epitaxy. In Raki&#263 AD, Yeow YT, editors, 2004 Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings. Brisbane, Australia ed. Vol. Not applicable. United States: IEEE, Institute of Electrical and Electronics Engineers. 2005. p. 65-68