@inproceedings{815bc49e784f459fbb04eb92fd9e2d50,
title = "Structural and compositional characterization of LiF thin films on Si",
abstract = "LiF thin films deposited on Si substrates have been found to exhibit interesting electronic properties that are dependent on the film thickness. The structural and compositional properties of LiF films have been studied via a combination of SEM imaging and TEM diffraction and energy-selected imaging in an attempt to correlate the structural, compositional and electronic properties of the films.",
author = "Alexandra Suvorova and Martin Saunders and Brendan Griffin and S.N. Samarin",
year = "2004",
language = "English",
isbn = "0750309679",
volume = "179",
series = "Institute of Physics Conference Series",
publisher = "Institute of Physics Publishing",
pages = "57--60",
editor = "S. McVitie and D. McComb",
booktitle = "Electron Microscopy & Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy & Analysis Group Conf.",
address = "United States",
edition = "The University of Oxford",
note = "Electron Microscopy and Analysis 2003 - Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference ; Conference date: 03-09-2003 Through 05-09-2003",
}