TY - JOUR
T1 - Structural and analytical characterization of as-grown MgB2 film sputtered on differently oriented α-Al2O3 substrate
AU - Moon, W-J.
AU - Kaneko, K.
AU - Toh, S.
AU - Saunders, Martin
AU - Saito, A.
AU - Wang, Z.
AU - Abe, H.
AU - Naito, M.
PY - 2005
Y1 - 2005
N2 - Superconducting MgB2 films were prepared on differently oriented alpha-Al2O3 substrates, C- and R-planes, which yielded superconducting transition temperatures of about 28 K. The electric resistivity of the MgB2 film deposited on an R-plane substrate is 300 muOmega cm, six times larger than that on a C-plane substrate, 50 muOmega cm. To understand these differences in the electrical properties, various transmission electron microscopes were used to carry out a structural and the compositional analysis. It was shown from selected-area electron diffraction patterns that the microstructure consists of a mixture of columnar MgB2 grains and amorphous phases in the case of the R-plane specimen, while no amorphous phase was present in the case of the C-plane specimen.
AB - Superconducting MgB2 films were prepared on differently oriented alpha-Al2O3 substrates, C- and R-planes, which yielded superconducting transition temperatures of about 28 K. The electric resistivity of the MgB2 film deposited on an R-plane substrate is 300 muOmega cm, six times larger than that on a C-plane substrate, 50 muOmega cm. To understand these differences in the electrical properties, various transmission electron microscopes were used to carry out a structural and the compositional analysis. It was shown from selected-area electron diffraction patterns that the microstructure consists of a mixture of columnar MgB2 grains and amorphous phases in the case of the R-plane specimen, while no amorphous phase was present in the case of the C-plane specimen.
U2 - 10.1088/0953-2048/18/1/015
DO - 10.1088/0953-2048/18/1/015
M3 - Article
VL - 18
SP - 92
EP - 100
JO - SUPERCONDUCTOR SCIENCE & TECHNOLOGY
JF - SUPERCONDUCTOR SCIENCE & TECHNOLOGY
SN - 0953-2048
IS - 1
ER -