Structural and analytical characterization of as-grown MgB2 film sputtered on differently oriented α-Al2O3 substrate

W-J. Moon, K. Kaneko, S. Toh, Martin Saunders, A. Saito, Z. Wang, H. Abe, M. Naito

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Superconducting MgB2 films were prepared on differently oriented alpha-Al2O3 substrates, C- and R-planes, which yielded superconducting transition temperatures of about 28 K. The electric resistivity of the MgB2 film deposited on an R-plane substrate is 300 muOmega cm, six times larger than that on a C-plane substrate, 50 muOmega cm. To understand these differences in the electrical properties, various transmission electron microscopes were used to carry out a structural and the compositional analysis. It was shown from selected-area electron diffraction patterns that the microstructure consists of a mixture of columnar MgB2 grains and amorphous phases in the case of the R-plane specimen, while no amorphous phase was present in the case of the C-plane specimen.
Original languageEnglish
Pages (from-to)92-100
JournalSUPERCONDUCTOR SCIENCE & TECHNOLOGY
Volume18
Issue number1
DOIs
Publication statusPublished - 2005

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