Stress relaxation mechanism in mismatched epitaxial growth of HgCdTe

Richard Sewell, John Dell, Charles Musca, Lorenzo Faraone

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationProceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000)
EditorsLeonard D. Broekman, Brian F. Usher, John D. Riley
Place of PublicationUSA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages97-100
Volume1
EditionLa Trobe University, Melbourne
ISBN (Print)0780366980
Publication statusPublished - 2002
EventStress relaxation mechanism in mismatched epitaxial growth of HgCdTe - La Trobe University, Melbourne
Duration: 1 Jan 2002 → …

Conference

ConferenceStress relaxation mechanism in mismatched epitaxial growth of HgCdTe
Period1/01/02 → …

Cite this