Statistical Analysis for Weibull Distributions in Presence of Right and Left Censoring

Adriano Polpo, Marcos Coque-, Carlos Pereira

Research output: Chapter in Book/Conference paperConference paper

6 Citations (Scopus)

Abstract

Series system reliability is based on the minimum life time of its components. Its dual, the parallel system, is based on maximum. Here, we consider the statistical analysis of both, series and parallel, systems where the components follow the Weibull parametric model. Our perspective is Bayesian. Due to the mathematical complexity, to obtain the posterior distribution we use the Metropolis-Hasting simulation method. Based on this posterior, we evaluated the evidence of the Full Bayesian Significance Test (FBST) for comparing the reliabilities of the components. The reason for using FBST is the fact that we are testing precise hypotheses. We also compute the probability of a particular component be responsible for the system failure. An example illustrates the methodology.

Original languageEnglish
Title of host publicationPROCEEDINGS OF 2009 8TH INTERNATIONAL CONFERENCE ON RELIABILITY, MAINTAINABILITY AND SAFETY, VOLS I AND II
EditorsR Kang, HZ Huang, MJ Zuo, Q Miao
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages219-223
Number of pages5
ISBN (Print)978-1-4244-4903-3
DOIs
Publication statusPublished - 2009
Externally publishedYes
Event8th International Conference on Reliability, Maintainability and Safety (ICRMS 2009) - Chengdu, China
Duration: 20 Jul 200924 Jul 2009
Conference number: 8

Conference

Conference8th International Conference on Reliability, Maintainability and Safety (ICRMS 2009)
Abbreviated titleICRMS 2009
CountryChina
CityChengdu
Period20/07/0924/07/09

Cite this

Polpo, A., Coque-, M., & Pereira, C. (2009). Statistical Analysis for Weibull Distributions in Presence of Right and Left Censoring. In R. Kang, HZ. Huang, MJ. Zuo, & Q. Miao (Eds.), PROCEEDINGS OF 2009 8TH INTERNATIONAL CONFERENCE ON RELIABILITY, MAINTAINABILITY AND SAFETY, VOLS I AND II (pp. 219-223). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICRMS.2009.5270204