### Abstract

Series system reliability is based on the minimum life time of its components. Its dual, the parallel system, is based on maximum. Here, we consider the statistical analysis of both, series and parallel, systems where the components follow the Weibull parametric model. Our perspective is Bayesian. Due to the mathematical complexity, to obtain the posterior distribution we use the Metropolis-Hasting simulation method. Based on this posterior, we evaluated the evidence of the Full Bayesian Significance Test (FBST) for comparing the reliabilities of the components. The reason for using FBST is the fact that we are testing precise hypotheses. We also compute the probability of a particular component be responsible for the system failure. An example illustrates the methodology.

Original language | English |
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Title of host publication | PROCEEDINGS OF 2009 8TH INTERNATIONAL CONFERENCE ON RELIABILITY, MAINTAINABILITY AND SAFETY, VOLS I AND II |

Editors | R Kang, HZ Huang, MJ Zuo, Q Miao |

Publisher | IEEE, Institute of Electrical and Electronics Engineers |

Pages | 219-223 |

Number of pages | 5 |

ISBN (Print) | 978-1-4244-4903-3 |

DOIs | |

Publication status | Published - 2009 |

Externally published | Yes |

Event | 8th International Conference on Reliability, Maintainability and Safety (ICRMS 2009) - Chengdu, China Duration: 20 Jul 2009 → 24 Jul 2009 Conference number: 8 |

### Conference

Conference | 8th International Conference on Reliability, Maintainability and Safety (ICRMS 2009) |
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Abbreviated title | ICRMS 2009 |

Country | China |

City | Chengdu |

Period | 20/07/09 → 24/07/09 |

## Cite this

*PROCEEDINGS OF 2009 8TH INTERNATIONAL CONFERENCE ON RELIABILITY, MAINTAINABILITY AND SAFETY, VOLS I AND II*(pp. 219-223). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICRMS.2009.5270204