@article{4c2eed701e47478baeff5db16a982d5a,
title = "Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-{\AA}ngstr{\"o}m emitter localization",
abstract = "Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.",
keywords = "color centers, nanoscopy, ODMR, solid immersion lens, STED",
author = "Dominik Wildanger and Patton, {Brian R.} and Heiko Schill and Luca Marseglia and Hadden, {J. P.} and Sebastian Knauer and Andreas Sch{\"o}nle and Rarity, {John G.} and O'Brien, {Jeremy L.} and Hell, {Stefan W.} and Smith, {Jason M.}",
year = "2012",
month = nov,
day = "20",
doi = "10.1002/adma.201203033",
language = "English",
volume = "24",
journal = "Advanced Materials",
issn = "0935-9648",
publisher = "Wiley-VCH Verlag GmbH & Co. KGaA",
number = "44",
}