Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-Ångström emitter localization

Dominik Wildanger, Brian R. Patton, Heiko Schill, Luca Marseglia, J. P. Hadden, Sebastian Knauer, Andreas Schönle, John G. Rarity, Jeremy L. O'Brien, Stefan W. Hell, Jason M. Smith

Research output: Contribution to journalArticlepeer-review

121 Citations (Scopus)

Abstract

Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.

Original languageEnglish
JournalAdvanced Materials
Volume24
Issue number44
DOIs
Publication statusPublished - 20 Nov 2012
Externally publishedYes

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