Single-qubit, entanglement-assisted and ancilla-assisted quantum process tomography

J. B. Altepeter, D. Branning, E. Jeffrey, T. C. Wei, P. G. Kwiat, R. T. Thew, J. L. O'Brien, M. A. Nielsen, A. G. White

Research output: Contribution to conferenceConference presentation/ephemera

Abstract

Quantum process tomography allows complete and precise characterization of a quantum operation. We report quantum process tomography of unitary, decohering, and partially polarizing operations using single-qubit, maximally entangled, and non-entangled input states.

Original languageEnglish
DOIs
Publication statusPublished - 1 Dec 2003
Externally publishedYes
EventTrends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS) - Baltimore, MD., United States
Duration: 1 Jun 20036 Jun 2003

Conference

ConferenceTrends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS)
CountryUnited States
CityBaltimore, MD.
Period1/06/036/06/03

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