Sensitivity and resolution in optical coherence micro-elastography

Research output: Chapter in Book/Conference paperConference paper

Abstract

This study describes a framework for characterizing resolution and sensitivity in optical coherence micro-elastography, and presents a means of optimizing these parameters through spatial filtering. Results show improved axial resolution with no loss in sensitivity. © 2015 IEEE.
Original languageEnglish
Title of host publication2015 IEEE Photonics Conference,
Place of PublicationUSA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages1-2
Volume-
ISBN (Print)9781479974665
DOIs
Publication statusPublished - 9 Nov 2015
Event2015 IEEE Photonics Conference, IPC 2015 - Hyatt Regency Reston, Reston, VA, United States
Duration: 4 Oct 20158 Oct 2015
Conference number: 30449

Conference

Conference2015 IEEE Photonics Conference, IPC 2015
Abbreviated titleIPC 2015
CountryUnited States
CityReston, VA
Period4/10/158/10/15

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Chin, L., Curatolo, A., Wijesinghe, P., Kennedy, K., Mclaughlin, R., Kennedy, B., & Sampson, D. (2015). Sensitivity and resolution in optical coherence micro-elastography. In 2015 IEEE Photonics Conference, (Vol. -, pp. 1-2). [7323503] USA: IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/IPCon.2015.7323503
Chin, Lixin ; Curatolo, Andrea ; Wijesinghe, P. ; Kennedy, Kelsey ; Mclaughlin, Robert ; Kennedy, Brendan ; Sampson, David. / Sensitivity and resolution in optical coherence micro-elastography. 2015 IEEE Photonics Conference, . Vol. - USA : IEEE, Institute of Electrical and Electronics Engineers, 2015. pp. 1-2
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author = "Lixin Chin and Andrea Curatolo and P. Wijesinghe and Kelsey Kennedy and Robert Mclaughlin and Brendan Kennedy and David Sampson",
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Chin, L, Curatolo, A, Wijesinghe, P, Kennedy, K, Mclaughlin, R, Kennedy, B & Sampson, D 2015, Sensitivity and resolution in optical coherence micro-elastography. in 2015 IEEE Photonics Conference, . vol. -, 7323503, IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 1-2, 2015 IEEE Photonics Conference, IPC 2015, Reston, VA, United States, 4/10/15. https://doi.org/10.1109/IPCon.2015.7323503

Sensitivity and resolution in optical coherence micro-elastography. / Chin, Lixin; Curatolo, Andrea; Wijesinghe, P.; Kennedy, Kelsey; Mclaughlin, Robert; Kennedy, Brendan; Sampson, David.

2015 IEEE Photonics Conference, . Vol. - USA : IEEE, Institute of Electrical and Electronics Engineers, 2015. p. 1-2 7323503.

Research output: Chapter in Book/Conference paperConference paper

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T1 - Sensitivity and resolution in optical coherence micro-elastography

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AU - Kennedy, Brendan

AU - Sampson, David

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Chin L, Curatolo A, Wijesinghe P, Kennedy K, Mclaughlin R, Kennedy B et al. Sensitivity and resolution in optical coherence micro-elastography. In 2015 IEEE Photonics Conference, . Vol. -. USA: IEEE, Institute of Electrical and Electronics Engineers. 2015. p. 1-2. 7323503 https://doi.org/10.1109/IPCon.2015.7323503