Abstract
This study describes a framework for characterizing resolution and sensitivity in optical coherence micro-elastography, and presents a means of optimizing these parameters through spatial filtering. Results show improved axial resolution with no loss in sensitivity. © 2015 IEEE.
Original language | English |
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Title of host publication | 2015 IEEE Photonics Conference, |
Place of Publication | USA |
Publisher | IEEE, Institute of Electrical and Electronics Engineers |
Pages | 1-2 |
Volume | - |
ISBN (Print) | 9781479974665 |
DOIs | |
Publication status | Published - 9 Nov 2015 |
Event | 2015 IEEE Photonics Conference, IPC 2015 - Hyatt Regency Reston, Reston, VA, United States Duration: 4 Oct 2015 → 8 Oct 2015 Conference number: 30449 |
Conference
Conference | 2015 IEEE Photonics Conference, IPC 2015 |
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Abbreviated title | IPC 2015 |
Country/Territory | United States |
City | Reston, VA |
Period | 4/10/15 → 8/10/15 |