Sensitivity and resolution in optical coherence micro-elastography

Lixin Chin, Andrea Curatolo, P. Wijesinghe, Kelsey Kennedy, Robert Mclaughlin, Brendan Kennedy, David Sampson

Research output: Chapter in Book/Conference paperConference paperpeer-review

2 Citations (Scopus)

Abstract

This study describes a framework for characterizing resolution and sensitivity in optical coherence micro-elastography, and presents a means of optimizing these parameters through spatial filtering. Results show improved axial resolution with no loss in sensitivity. © 2015 IEEE.
Original languageEnglish
Title of host publication2015 IEEE Photonics Conference,
Place of PublicationUSA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages1-2
Volume-
ISBN (Print)9781479974665
DOIs
Publication statusPublished - 9 Nov 2015
Event2015 IEEE Photonics Conference, IPC 2015 - Hyatt Regency Reston, Reston, VA, United States
Duration: 4 Oct 20158 Oct 2015
Conference number: 30449

Conference

Conference2015 IEEE Photonics Conference, IPC 2015
Abbreviated titleIPC 2015
Country/TerritoryUnited States
CityReston, VA
Period4/10/158/10/15

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