Selection of magnetic fields for magneto-transport experiments

D.A. Redfern; Jarek Antoszewski; Lorenzo Faraone

Selection of magnetic fields for magneto-transport experiments

D.A. Redfern, Jarek Antoszewski, Lorenzo Faraone

Graduate Research School

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000)
Editors	Leonard D. Broekman, Brian F. Usher, John D. Riley
Place of Publication	USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	467-470
Volume	1
Edition	La Trobe University, Melbourne
ISBN (Print)	0780366980
Publication status	Published - 2002
Event	Selection of magnetic fields for magneto-transport experiments - La Trobe University, Melbourne Duration: 1 Jan 2002 → …

Conference

Conference	Selection of magnetic fields for magneto-transport experiments
Period	1/01/02 → …

Cite this

Redfern, D. A., Antoszewski, J., & Faraone, L. (2002). Selection of magnetic fields for magneto-transport experiments. In L. D. Broekman, B. F. Usher, & J. D. Riley (Eds.), Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000) (La Trobe University, Melbourne ed., Vol. 1, pp. 467-470). IEEE, Institute of Electrical and Electronics Engineers.

Redfern, D.A. ; Antoszewski, Jarek ; Faraone, Lorenzo. / Selection of magnetic fields for magneto-transport experiments. Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000). editor / Leonard D. Broekman ; Brian F. Usher ; John D. Riley. Vol. 1 La Trobe University, Melbourne. ed. USA : IEEE, Institute of Electrical and Electronics Engineers, 2002. pp. 467-470

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title = "Selection of magnetic fields for magneto-transport experiments",

author = "D.A. Redfern and Jarek Antoszewski and Lorenzo Faraone",

year = "2002",

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booktitle = "Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000)",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

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note = "Selection of magnetic fields for magneto-transport experiments ; Conference date: 01-01-2002",

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Redfern, DA, Antoszewski, J & Faraone, L 2002, Selection of magnetic fields for magneto-transport experiments. in LD Broekman, BF Usher & JD Riley (eds), Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000). La Trobe University, Melbourne edn, vol. 1, IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 467-470, Selection of magnetic fields for magneto-transport experiments, 1/01/02.

Selection of magnetic fields for magneto-transport experiments. / Redfern, D.A.; Antoszewski, Jarek ; Faraone, Lorenzo.

Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000). ed. / Leonard D. Broekman; Brian F. Usher; John D. Riley. Vol. 1 La Trobe University, Melbourne. ed. USA : IEEE, Institute of Electrical and Electronics Engineers, 2002. p. 467-470.

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

TY - GEN

T1 - Selection of magnetic fields for magneto-transport experiments

AU - Redfern, D.A.

AU - Antoszewski, Jarek

AU - Faraone, Lorenzo

PY - 2002

Y1 - 2002

M3 - Conference paper

SN - 0780366980

VL - 1

SP - 467

EP - 470

BT - Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000)

A2 - Broekman, Leonard D.

A2 - Usher, Brian F.

A2 - Riley, John D.

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - USA

T2 - Selection of magnetic fields for magneto-transport experiments

Y2 - 1 January 2002

ER -

Redfern DA, Antoszewski J , Faraone L. Selection of magnetic fields for magneto-transport experiments. In Broekman LD, Usher BF, Riley JD, editors, Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2000). La Trobe University, Melbourne ed. Vol. 1. USA: IEEE, Institute of Electrical and Electronics Engineers. 2002. p. 467-470