Rotating Dual Cryogenic Sapphire Oscillators with 10−16 Fractional Frequency Stability for Tests of Lorentz Invariance

Stephen  Parker; Paul  Stanwix; Michael  Tobar; John  Hartnett; Eugene  Ivanov; Moritz Nagel; Achim Peters

doi:10.1109/FCS.2011.5977318

Rotating Dual Cryogenic Sapphire Oscillators with 10−16 Fractional Frequency Stability for Tests of Lorentz Invariance

Stephen Parker, Paul Stanwix, Michael Tobar, John Hartnett, Eugene Ivanov, Moritz Nagel, Achim Peters

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Abstract

We describe the latest improvements and current status of our cryogenic sapphire oscillator Michelson-Morley experiment that has recently been moved from The University of Western Australia to Humboldt University of Berlin.

Original language	English
Title of host publication	2011 Joint Conference of the IEEE International Frequency Control and the European Frequency and Time Forum Proceedings
Editors	Clark T.-C. Nguyen, Giorgio Santarelli
Place of Publication	San Fransisco, CA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Number of pages	2
ISBN (Print)	9781612841113
DOIs	https://doi.org/10.1109/FCS.2011.5977318
Publication status	Published - 2011
Event	Joint Conference of the 65th IEEE International Frequency Control Symposium and 25th European Frequency and Time Forum - San Fransisco, United States Duration: 1 May 2011 → 5 May 2011

Conference

Conference	Joint Conference of the 65th IEEE International Frequency Control Symposium and 25th European Frequency and Time Forum
Country/Territory	United States
City	San Fransisco
Period	1/05/11 → 5/05/11

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10.1109/FCS.2011.5977318

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Parker, S., Stanwix, P., Tobar, M., Hartnett, J., Ivanov, E., Nagel, M., & Peters, A. (2011). Rotating Dual Cryogenic Sapphire Oscillators with 10−16 Fractional Frequency Stability for Tests of Lorentz Invariance. In C. T.-C. Nguyen, & G. Santarelli (Eds.), 2011 Joint Conference of the IEEE International Frequency Control and the European Frequency and Time Forum Proceedings IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/FCS.2011.5977318

Parker, Stephen ; Stanwix, Paul ; Tobar, Michael et al. / Rotating Dual Cryogenic Sapphire Oscillators with 10−16 Fractional Frequency Stability for Tests of Lorentz Invariance. 2011 Joint Conference of the IEEE International Frequency Control and the European Frequency and Time Forum Proceedings. editor / Clark T.-C. Nguyen ; Giorgio Santarelli. San Fransisco, CA : IEEE, Institute of Electrical and Electronics Engineers, 2011.

@inproceedings{a3d6886744774bceaa75fdcb3f8139ac,

title = "Rotating Dual Cryogenic Sapphire Oscillators with 10−16 Fractional Frequency Stability for Tests of Lorentz Invariance",

abstract = "We describe the latest improvements and current status of our cryogenic sapphire oscillator Michelson-Morley experiment that has recently been moved from The University of Western Australia to Humboldt University of Berlin.",

author = "Stephen Parker and Paul Stanwix and Michael Tobar and John Hartnett and Eugene Ivanov and Moritz Nagel and Achim Peters",

year = "2011",

doi = "10.1109/FCS.2011.5977318",

language = "English",

isbn = "9781612841113",

editor = "Nguyen, { Clark T.-C. } and Santarelli, {Giorgio }",

booktitle = "2011 Joint Conference of the IEEE International Frequency Control and the European Frequency and Time Forum Proceedings",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

note = "Joint Conference of the 65th IEEE International Frequency Control Symposium and 25th European Frequency and Time Forum ; Conference date: 01-05-2011 Through 05-05-2011",

}

Parker, S, Stanwix, P , Tobar, M, Hartnett, J, Ivanov, E, Nagel, M & Peters, A 2011, Rotating Dual Cryogenic Sapphire Oscillators with 10−16 Fractional Frequency Stability for Tests of Lorentz Invariance. in CT-C Nguyen & G Santarelli (eds), 2011 Joint Conference of the IEEE International Frequency Control and the European Frequency and Time Forum Proceedings. IEEE, Institute of Electrical and Electronics Engineers, San Fransisco, CA, Joint Conference of the 65th IEEE International Frequency Control Symposium and 25th European Frequency and Time Forum, San Fransisco, California, United States, 1/05/11. https://doi.org/10.1109/FCS.2011.5977318

Rotating Dual Cryogenic Sapphire Oscillators with 10−16 Fractional Frequency Stability for Tests of Lorentz Invariance. / Parker, Stephen ; Stanwix, Paul ; Tobar, Michael et al.
2011 Joint Conference of the IEEE International Frequency Control and the European Frequency and Time Forum Proceedings. ed. / Clark T.-C. Nguyen; Giorgio Santarelli. San Fransisco, CA: IEEE, Institute of Electrical and Electronics Engineers, 2011.

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

TY - GEN

T1 - Rotating Dual Cryogenic Sapphire Oscillators with 10−16 Fractional Frequency Stability for Tests of Lorentz Invariance

AU - Parker, Stephen

AU - Stanwix, Paul

AU - Tobar, Michael

AU - Hartnett, John

AU - Ivanov, Eugene

AU - Nagel, Moritz

AU - Peters, Achim

PY - 2011

Y1 - 2011

N2 - We describe the latest improvements and current status of our cryogenic sapphire oscillator Michelson-Morley experiment that has recently been moved from The University of Western Australia to Humboldt University of Berlin.

AB - We describe the latest improvements and current status of our cryogenic sapphire oscillator Michelson-Morley experiment that has recently been moved from The University of Western Australia to Humboldt University of Berlin.

U2 - 10.1109/FCS.2011.5977318

DO - 10.1109/FCS.2011.5977318

M3 - Conference paper

SN - 9781612841113

BT - 2011 Joint Conference of the IEEE International Frequency Control and the European Frequency and Time Forum Proceedings

A2 - Nguyen, Clark T.-C.

A2 - Santarelli, Giorgio

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - San Fransisco, CA

T2 - Joint Conference of the 65th IEEE International Frequency Control Symposium and 25th European Frequency and Time Forum

Y2 - 1 May 2011 through 5 May 2011

ER -

Parker S, Stanwix P , Tobar M, Hartnett J, Ivanov E, Nagel M et al. Rotating Dual Cryogenic Sapphire Oscillators with 10−16 Fractional Frequency Stability for Tests of Lorentz Invariance. In Nguyen CTC, Santarelli G, editors, 2011 Joint Conference of the IEEE International Frequency Control and the European Frequency and Time Forum Proceedings. San Fransisco, CA: IEEE, Institute of Electrical and Electronics Engineers. 2011 doi: 10.1109/FCS.2011.5977318

Rotating Dual Cryogenic Sapphire Oscillators with 10−16 Fractional Frequency Stability for Tests of Lorentz Invariance

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