Original language | English |
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Pages (from-to) | 7235-7237 |
Journal | Journal of Applied Physics |
Volume | 93 |
Issue number | 10 |
DOIs | |
Publication status | Published - 2003 |
Robust exchange coupling in bilayer exchange-spring thin films
David Crew, J. Kim, K. Barmak, L.H. Lewis
Research output: Contribution to journal › Article
10
Citations
(Scopus)