Robust exchange coupling in bilayer exchange-spring thin films

David Crew, J. Kim, K. Barmak, L.H. Lewis

Research output: Contribution to journalArticle

10 Citations (Scopus)
Original languageEnglish
Pages (from-to)7235-7237
JournalJournal of Applied Physics
Volume93
Issue number10
DOIs
Publication statusPublished - 2003

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