Resonator power to frequency conversion in a cryogenic sapphire oscillator

N.R. Nand, Stephen Parker, Eugene Ivanov, Jean-Michel Le Floch, J.G. Hartnett, Michael Tobar

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)


We report on the measurement and characterization of power to frequency conversion in the resonant mode of a cryogenic sapphire loaded cavity resonator, which is used as the frequency discriminating element of a loop oscillator circuit. Fluctuations of power incident on the resonator lead to changes in radiation pressure and temperature in the sapphire dielectric, both of which contribute to a shift in the resonance frequency. We measure a modulation and temperature independent radiation pressure induced power to frequency sensitivity of -0.15 Hz/mW and find that this is the primary factor limiting the stability of the resonator frequency. © 2013 AIP Publishing LLC.
Original languageEnglish
Pages (from-to)043502-1 - 043502-4
JournalApplied Physics Letters
Issue number4
Publication statusPublished - 2013


Dive into the research topics of 'Resonator power to frequency conversion in a cryogenic sapphire oscillator'. Together they form a unique fingerprint.

Cite this