Resonator power to frequency conversion in a cryogenic sapphire oscillator

N.R. Nand; Stephen Parker; Eugene Ivanov; Jean-Michel Le Floch; J.G. Hartnett; Michael Tobar

doi:10.1063/1.4816284

Resonator power to frequency conversion in a cryogenic sapphire oscillator

N.R. Nand, Stephen Parker, Eugene Ivanov, Jean-Michel Le Floch, J.G. Hartnett, Michael Tobar

Graduate Research School

Research output: Contribution to journal › Article › peer-review

16 Citations (Scopus)

Abstract

We report on the measurement and characterization of power to frequency conversion in the resonant mode of a cryogenic sapphire loaded cavity resonator, which is used as the frequency discriminating element of a loop oscillator circuit. Fluctuations of power incident on the resonator lead to changes in radiation pressure and temperature in the sapphire dielectric, both of which contribute to a shift in the resonance frequency. We measure a modulation and temperature independent radiation pressure induced power to frequency sensitivity of -0.15 Hz/mW and find that this is the primary factor limiting the stability of the resonator frequency. © 2013 AIP Publishing LLC.

Original language	English
Pages (from-to)	043502-1 - 043502-4
Journal	Applied Physics Letters
Volume	103
Issue number	4
DOIs	https://doi.org/10.1063/1.4816284
Publication status	Published - 2013

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abstract = "We report on the measurement and characterization of power to frequency conversion in the resonant mode of a cryogenic sapphire loaded cavity resonator, which is used as the frequency discriminating element of a loop oscillator circuit. Fluctuations of power incident on the resonator lead to changes in radiation pressure and temperature in the sapphire dielectric, both of which contribute to a shift in the resonance frequency. We measure a modulation and temperature independent radiation pressure induced power to frequency sensitivity of -0.15 Hz/mW and find that this is the primary factor limiting the stability of the resonator frequency. {\textcopyright} 2013 AIP Publishing LLC.",

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AU - Nand, N.R.

AU - Parker, Stephen

AU - Ivanov, Eugene

AU - Le Floch, Jean-Michel

AU - Hartnett, J.G.

AU - Tobar, Michael

PY - 2013

Y1 - 2013

N2 - We report on the measurement and characterization of power to frequency conversion in the resonant mode of a cryogenic sapphire loaded cavity resonator, which is used as the frequency discriminating element of a loop oscillator circuit. Fluctuations of power incident on the resonator lead to changes in radiation pressure and temperature in the sapphire dielectric, both of which contribute to a shift in the resonance frequency. We measure a modulation and temperature independent radiation pressure induced power to frequency sensitivity of -0.15 Hz/mW and find that this is the primary factor limiting the stability of the resonator frequency. © 2013 AIP Publishing LLC.

AB - We report on the measurement and characterization of power to frequency conversion in the resonant mode of a cryogenic sapphire loaded cavity resonator, which is used as the frequency discriminating element of a loop oscillator circuit. Fluctuations of power incident on the resonator lead to changes in radiation pressure and temperature in the sapphire dielectric, both of which contribute to a shift in the resonance frequency. We measure a modulation and temperature independent radiation pressure induced power to frequency sensitivity of -0.15 Hz/mW and find that this is the primary factor limiting the stability of the resonator frequency. © 2013 AIP Publishing LLC.

U2 - 10.1063/1.4816284

DO - 10.1063/1.4816284

M3 - Article

VL - 103

SP - 043502-1 - 043502-4

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 4

ER -

Resonator power to frequency conversion in a cryogenic sapphire oscillator

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