Recent advances in quantitative convergent beam electron diffraction

M Saunders, P Midgley, R Vincent, J Steeds

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Abstract

Two recent advances in quantitative convergent beam electron diffraction (CBED) developed at the University of Bristol are described in this paper, The first is a new scanning technique in which the diffracted intensities in the resulting pattern are integrated through the Bragg condition, equivalent to precessing the sample around a stationary beam, Many more reflections are excited than in a conventional diffraction pattern, excitation errors are removed and non-systematic dynamical interactions are reduced, This new technique is used for an ab-initio structure determination of Er2Ge2O7, the results of which are presented and compared to those from single crystal X-ray studies, The second technique is a method of making accurate bond (deformation) charge measurements for known structures by zone-axis CBED pattern matching, Results for Si [110] patterns obtained from a Hitachi HF2000 FEG-TEM with a Gatan Imaging Filter are discussed, These results are in excellent agreement with those obtained previously using the X-ray Pendellosung technique.

Original languageEnglish
Pages (from-to)11-18
Number of pages8
JournalMicroscopy
Volume45
Issue number1
DOIs
Publication statusPublished - Feb 1996
Externally publishedYes

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