TY - JOUR
T1 - Recent advances in quantitative convergent beam electron diffraction
AU - Saunders, M
AU - Midgley, P
AU - Vincent, R
AU - Steeds, J
PY - 1996/2
Y1 - 1996/2
N2 - Two recent advances in quantitative convergent beam electron diffraction (CBED) developed at the University of Bristol are described in this paper, The first is a new scanning technique in which the diffracted intensities in the resulting pattern are integrated through the Bragg condition, equivalent to precessing the sample around a stationary beam, Many more reflections are excited than in a conventional diffraction pattern, excitation errors are removed and non-systematic dynamical interactions are reduced, This new technique is used for an ab-initio structure determination of Er2Ge2O7, the results of which are presented and compared to those from single crystal X-ray studies, The second technique is a method of making accurate bond (deformation) charge measurements for known structures by zone-axis CBED pattern matching, Results for Si [110] patterns obtained from a Hitachi HF2000 FEG-TEM with a Gatan Imaging Filter are discussed, These results are in excellent agreement with those obtained previously using the X-ray Pendellosung technique.
AB - Two recent advances in quantitative convergent beam electron diffraction (CBED) developed at the University of Bristol are described in this paper, The first is a new scanning technique in which the diffracted intensities in the resulting pattern are integrated through the Bragg condition, equivalent to precessing the sample around a stationary beam, Many more reflections are excited than in a conventional diffraction pattern, excitation errors are removed and non-systematic dynamical interactions are reduced, This new technique is used for an ab-initio structure determination of Er2Ge2O7, the results of which are presented and compared to those from single crystal X-ray studies, The second technique is a method of making accurate bond (deformation) charge measurements for known structures by zone-axis CBED pattern matching, Results for Si [110] patterns obtained from a Hitachi HF2000 FEG-TEM with a Gatan Imaging Filter are discussed, These results are in excellent agreement with those obtained previously using the X-ray Pendellosung technique.
KW - CBED
KW - structure determination
KW - precession patterns
KW - zone-axis pattern matching
KW - low-order structure factor refinement
KW - SILICON
U2 - 10.1093/oxfordjournals.jmicro.a023405
DO - 10.1093/oxfordjournals.jmicro.a023405
M3 - Article
VL - 45
SP - 11
EP - 18
JO - Microscopy
JF - Microscopy
SN - 0022-0744
IS - 1
ER -