Recent advances in FIB-based site-specific atom probe specimen preparation techniques

J.M. Cairney, W. Mckenzie, David Saxey, P.R. Munroe, S.P. Ringer

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationMicroscopy and Microanalysis 2007
Place of PublicationCambridge, UK
PublisherCambridge University Press
Pages1634-1635
Volume13 S02
ISBN (Print)14319276
DOIs
Publication statusPublished - 2007
EventMicroscopy and Microanalysis 2007 - Ft. Lauderdale, United States
Duration: 5 Aug 20079 Aug 2007

Conference

ConferenceMicroscopy and Microanalysis 2007
Country/TerritoryUnited States
CityFt. Lauderdale
Period5/08/079/08/07

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