Recent advances in FIB-based site-specific atom probe specimen preparation techniques

J.M. Cairney, W. Mckenzie, David Saxey, P.R. Munroe, S.P. Ringer

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationMicroscopy and Microanalysis 2007
Place of PublicationCambridge, UK
PublisherCambridge University Press
Pages1634-1635
Volume13 S02
ISBN (Print)14319276
DOIs
Publication statusPublished - 2007
EventRecent advances in FIB-based site-specific atom probe specimen preparation techniques - Ft. Lauderdale, Florida, USA
Duration: 1 Jan 2007 → …

Conference

ConferenceRecent advances in FIB-based site-specific atom probe specimen preparation techniques
Period1/01/07 → …

Cite this

Cairney, J. M., Mckenzie, W., Saxey, D., Munroe, P. R., & Ringer, S. P. (2007). Recent advances in FIB-based site-specific atom probe specimen preparation techniques. In Microscopy and Microanalysis 2007 (Vol. 13 S02, pp. 1634-1635). Cambridge, UK: Cambridge University Press. https://doi.org/10.1017/S1431927607071437
Cairney, J.M. ; Mckenzie, W. ; Saxey, David ; Munroe, P.R. ; Ringer, S.P. / Recent advances in FIB-based site-specific atom probe specimen preparation techniques. Microscopy and Microanalysis 2007. Vol. 13 S02 Cambridge, UK : Cambridge University Press, 2007. pp. 1634-1635
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Cairney, JM, Mckenzie, W, Saxey, D, Munroe, PR & Ringer, SP 2007, Recent advances in FIB-based site-specific atom probe specimen preparation techniques. in Microscopy and Microanalysis 2007. vol. 13 S02, Cambridge University Press, Cambridge, UK, pp. 1634-1635, Recent advances in FIB-based site-specific atom probe specimen preparation techniques, 1/01/07. https://doi.org/10.1017/S1431927607071437

Recent advances in FIB-based site-specific atom probe specimen preparation techniques. / Cairney, J.M.; Mckenzie, W.; Saxey, David; Munroe, P.R.; Ringer, S.P.

Microscopy and Microanalysis 2007. Vol. 13 S02 Cambridge, UK : Cambridge University Press, 2007. p. 1634-1635.

Research output: Chapter in Book/Conference paperConference paper

TY - GEN

T1 - Recent advances in FIB-based site-specific atom probe specimen preparation techniques

AU - Cairney, J.M.

AU - Mckenzie, W.

AU - Saxey, David

AU - Munroe, P.R.

AU - Ringer, S.P.

PY - 2007

Y1 - 2007

U2 - 10.1017/S1431927607071437

DO - 10.1017/S1431927607071437

M3 - Conference paper

SN - 14319276

VL - 13 S02

SP - 1634

EP - 1635

BT - Microscopy and Microanalysis 2007

PB - Cambridge University Press

CY - Cambridge, UK

ER -

Cairney JM, Mckenzie W, Saxey D, Munroe PR, Ringer SP. Recent advances in FIB-based site-specific atom probe specimen preparation techniques. In Microscopy and Microanalysis 2007. Vol. 13 S02. Cambridge, UK: Cambridge University Press. 2007. p. 1634-1635 https://doi.org/10.1017/S1431927607071437