Recent advances in FIB-based site-specific atom probe specimen preparation techniques

J.M. Cairney, W. Mckenzie, David Saxey, P.R. Munroe, S.P. Ringer

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationMicroscopy and Microanalysis 2007
Place of PublicationCambridge, UK
PublisherCambridge University Press
Pages1634-1635
Volume13 S02
ISBN (Print)14319276
DOIs
Publication statusPublished - 2007
EventRecent advances in FIB-based site-specific atom probe specimen preparation techniques - Ft. Lauderdale, Florida, USA
Duration: 1 Jan 2007 → …

Conference

ConferenceRecent advances in FIB-based site-specific atom probe specimen preparation techniques
Period1/01/07 → …

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