Random Walks on Graphs to Model Saliency in Images

V. Gopalakrishnan; Yiqun Hu; D. Rajan

doi:10.1109/CVPR.2009.5206767

Random Walks on Graphs to Model Saliency in Images

V. Gopalakrishnan, Yiqun Hu, D. Rajan

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

56 Citations (Web of Science)

Original language	English
Title of host publication	Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Place of Publication	United States
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	1698 - 1705
Volume	1
ISBN (Print)	9781424439928
DOIs	https://doi.org/10.1109/CVPR.2009.5206767
Publication status	Published - 2009
Event	2009 IEEE Conference on Computer Vision and Pattern Recognition - Miami, United States Duration: 20 Jun 2009 → 25 Jun 2009

Conference

Conference	2009 IEEE Conference on Computer Vision and Pattern Recognition
Abbreviated title	CVPR 2009
Country/Territory	United States
City	Miami
Period	20/06/09 → 25/06/09

Access to Document

10.1109/CVPR.2009.5206767

Cite this

@inproceedings{6839f36f889b464499edcbbd705b050a,

title = "Random Walks on Graphs to Model Saliency in Images",

author = "V. Gopalakrishnan and Yiqun Hu and D. Rajan",

year = "2009",

doi = "10.1109/CVPR.2009.5206767",

language = "English",

isbn = "9781424439928",

volume = "1",

pages = "1698 -- 1705",

booktitle = "Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

note = "2009 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2009 ; Conference date: 20-06-2009 Through 25-06-2009",

}

Gopalakrishnan, V, Hu, Y & Rajan, D 2009, Random Walks on Graphs to Model Saliency in Images. in Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on. vol. 1, IEEE, Institute of Electrical and Electronics Engineers, United States, pp. 1698 - 1705, 2009 IEEE Conference on Computer Vision and Pattern Recognition, Miami, Florida, United States, 20/06/09. https://doi.org/10.1109/CVPR.2009.5206767

TY - GEN

T1 - Random Walks on Graphs to Model Saliency in Images

AU - Gopalakrishnan, V.

AU - Hu, Yiqun

AU - Rajan, D.

PY - 2009

Y1 - 2009

U2 - 10.1109/CVPR.2009.5206767

DO - 10.1109/CVPR.2009.5206767

M3 - Conference paper

SN - 9781424439928

VL - 1

SP - 1698

EP - 1705

BT - Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - United States

T2 - 2009 IEEE Conference on Computer Vision and Pattern Recognition

Y2 - 20 June 2009 through 25 June 2009

ER -