Quantitative EDS analysis in the environmental scanning electron microscope (ESEM) using a bremstrahlung intensity-based correction for primary electron beam variation and scatter

Brendan Griffin; C.E. Nockolds

Quantitative EDS analysis in the environmental scanning electron microscope (ESEM) using a bremstrahlung intensity-based correction for primary electron beam variation and scatter

Brendan Griffin, C.E. Nockolds

Centre for Microscopy, Characterisation & Analysis

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Microscopy Society of America 54th Annual Meeting
Editors	G.W. Bailey, J.M. Corbett, R.V.W. Dimlich, J.R. Michael, N.J. Zaluzec
Place of Publication	San Francisco
Publisher	San Francisco Press, Inc.
Pages	842-843
Volume	1
Edition	Minneapolis
Publication status	Published - 1996
Event	Quantitative EDS analysis in the environmental scanning electron microscope (ESEM) using a bremstrahlung intensity-based correction for primary electron beam variation and scatter - Minneapolis Duration: 1 Jan 1996 → …

Conference

Conference	Quantitative EDS analysis in the environmental scanning electron microscope (ESEM) using a bremstrahlung intensity-based correction for primary electron beam variation and scatter
Period	1/01/96 → …

Cite this

Griffin, B., & Nockolds, C. E. (1996). Quantitative EDS analysis in the environmental scanning electron microscope (ESEM) using a bremstrahlung intensity-based correction for primary electron beam variation and scatter. In G. W. Bailey, J. M. Corbett, R. V. W. Dimlich, J. R. Michael, & N. J. Zaluzec (Eds.), Microscopy Society of America 54th Annual Meeting (Minneapolis ed., Vol. 1, pp. 842-843). San Francisco Press, Inc..

Griffin, Brendan ; Nockolds, C.E. / Quantitative EDS analysis in the environmental scanning electron microscope (ESEM) using a bremstrahlung intensity-based correction for primary electron beam variation and scatter. Microscopy Society of America 54th Annual Meeting. editor / G.W. Bailey ; J.M. Corbett ; R.V.W. Dimlich ; J.R. Michael ; N.J. Zaluzec. Vol. 1 Minneapolis. ed. San Francisco : San Francisco Press, Inc., 1996. pp. 842-843

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title = "Quantitative EDS analysis in the environmental scanning electron microscope (ESEM) using a bremstrahlung intensity-based correction for primary electron beam variation and scatter",

author = "Brendan Griffin and C.E. Nockolds",

year = "1996",

language = "English",

volume = "1",

pages = "842--843",

editor = "G.W. Bailey and J.M. Corbett and R.V.W. Dimlich and J.R. Michael and N.J. Zaluzec",

booktitle = "Microscopy Society of America 54th Annual Meeting",

publisher = "San Francisco Press, Inc.",

edition = "Minneapolis",

note = "Quantitative EDS analysis in the environmental scanning electron microscope (ESEM) using a bremstrahlung intensity-based correction for primary electron beam variation and scatter ; Conference date: 01-01-1996",

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Griffin, B & Nockolds, CE 1996, Quantitative EDS analysis in the environmental scanning electron microscope (ESEM) using a bremstrahlung intensity-based correction for primary electron beam variation and scatter. in GW Bailey, JM Corbett, RVW Dimlich, JR Michael & NJ Zaluzec (eds), Microscopy Society of America 54th Annual Meeting. Minneapolis edn, vol. 1, San Francisco Press, Inc., San Francisco, pp. 842-843, Quantitative EDS analysis in the environmental scanning electron microscope (ESEM) using a bremstrahlung intensity-based correction for primary electron beam variation and scatter, 1/01/96.

Quantitative EDS analysis in the environmental scanning electron microscope (ESEM) using a bremstrahlung intensity-based correction for primary electron beam variation and scatter. / Griffin, Brendan; Nockolds, C.E.
Microscopy Society of America 54th Annual Meeting. ed. / G.W. Bailey; J.M. Corbett; R.V.W. Dimlich; J.R. Michael; N.J. Zaluzec. Vol. 1 Minneapolis. ed. San Francisco: San Francisco Press, Inc., 1996. p. 842-843.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - Quantitative EDS analysis in the environmental scanning electron microscope (ESEM) using a bremstrahlung intensity-based correction for primary electron beam variation and scatter

AU - Griffin, Brendan

AU - Nockolds, C.E.

PY - 1996

Y1 - 1996

M3 - Conference paper

VL - 1

SP - 842

EP - 843

BT - Microscopy Society of America 54th Annual Meeting

A2 - Bailey, G.W.

A2 - Corbett, J.M.

A2 - Dimlich, R.V.W.

A2 - Michael, J.R.

A2 - Zaluzec, N.J.

PB - San Francisco Press, Inc.

CY - San Francisco

T2 - Quantitative EDS analysis in the environmental scanning electron microscope (ESEM) using a bremstrahlung intensity-based correction for primary electron beam variation and scatter

Y2 - 1 January 1996

ER -

Griffin B, Nockolds CE. Quantitative EDS analysis in the environmental scanning electron microscope (ESEM) using a bremstrahlung intensity-based correction for primary electron beam variation and scatter. In Bailey GW, Corbett JM, Dimlich RVW, Michael JR, Zaluzec NJ, editors, Microscopy Society of America 54th Annual Meeting. Minneapolis ed. Vol. 1. San Francisco: San Francisco Press, Inc. 1996. p. 842-843