Quantitative EDS analysis in the environmental scanning electron microscope (ESEM) using a bremstrahlung intensity-based correction for primary electron beam variation and scatter

Brendan Griffin, C.E. Nockolds

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationMicroscopy Society of America 54th Annual Meeting
EditorsG.W. Bailey, J.M. Corbett, R.V.W. Dimlich, J.R. Michael, N.J. Zaluzec
Place of PublicationSan Francisco
PublisherSan Francisco Press, Inc.
Pages842-843
Volume1
EditionMinneapolis
Publication statusPublished - 1996
EventQuantitative EDS analysis in the environmental scanning electron microscope (ESEM) using a bremstrahlung intensity-based correction for primary electron beam variation and scatter - Minneapolis
Duration: 1 Jan 1996 → …

Conference

ConferenceQuantitative EDS analysis in the environmental scanning electron microscope (ESEM) using a bremstrahlung intensity-based correction for primary electron beam variation and scatter
Period1/01/96 → …

Cite this

Griffin, B., & Nockolds, C. E. (1996). Quantitative EDS analysis in the environmental scanning electron microscope (ESEM) using a bremstrahlung intensity-based correction for primary electron beam variation and scatter. In G. W. Bailey, J. M. Corbett, R. V. W. Dimlich, J. R. Michael, & N. J. Zaluzec (Eds.), Microscopy Society of America 54th Annual Meeting (Minneapolis ed., Vol. 1, pp. 842-843). San Francisco Press, Inc..