Original language | English |
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Pages (from-to) | N/A |
Journal | International Journal of Recent Trends in Engineering and Technology |
Volume | 3 |
Issue number | 1 |
Publication status | Published - 2010 |
QCA Defect and Fault Analysis of Diverse nanostructure for implementing logic gate
K. Das, Debashis De
Research output: Contribution to journal › Article › peer-review