QCA Defect and Fault Analysis of Diverse nanostructure for implementing logic gate

K. Das, Debashis De

    Research output: Contribution to journalArticle

    Original languageEnglish
    Pages (from-to)N/A
    JournalInternational Journal of Recent Trends in Engineering and Technology
    Volume3
    Issue number1
    Publication statusPublished - 2010

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