| Original language | English |
|---|---|
| Pages (from-to) | N/A |
| Journal | International Journal of Recent Trends in Engineering and Technology |
| Volume | 3 |
| Issue number | 1 |
| Publication status | Published - 2010 |
QCA Defect and Fault Analysis of Diverse nanostructure for implementing logic gate
K. Das, Debashis De
Research output: Contribution to journal › Article › peer-review