Preparation of Site Specific Atom Probe Tips using Focused Ion Beam Technology

D. Mcgrouther; W. Mckenzie; David Saxey; J.M. Cairney; R. Marceau; S.P. Ringer; P.R. Munroe

doi:10.1017/S1431927606062866

Preparation of Site Specific Atom Probe Tips using Focused Ion Beam Technology

D. Mcgrouther, W. Mckenzie, David Saxey, J.M. Cairney, R. Marceau, S.P. Ringer, P.R. Munroe

Graduate Research School

Research output: Chapter in Book/Conference paper › Conference paper

1 Citation (Scopus)

Original language	English
Title of host publication	Microscopy and Microanalysis 2006
Place of Publication	Cambridge, UK
Publisher	Cambridge University Press
Pages	1296-1297
Volume	12 S02
ISBN (Print)	14319276
DOIs	https://doi.org/10.1017/S1431927606062866
Publication status	Published - 2006
Event	Microscopy and Microanalysis 2006 - Chicago, United States Duration: 30 Jul 2006 → 3 Aug 2006

Conference

Conference	Microscopy and Microanalysis 2006
Country/Territory	United States
City	Chicago
Period	30/07/06 → 3/08/06

Access to Document

10.1017/S1431927606062866

Cite this

@inproceedings{b11f8483373149eb8ace618dcd6c866b,

title = "Preparation of Site Specific Atom Probe Tips using Focused Ion Beam Technology",

author = "D. Mcgrouther and W. Mckenzie and David Saxey and J.M. Cairney and R. Marceau and S.P. Ringer and P.R. Munroe",

year = "2006",

doi = "10.1017/S1431927606062866",

language = "English",

isbn = "14319276",

volume = "12 S02",

pages = "1296--1297",

booktitle = "Microscopy and Microanalysis 2006",

publisher = "Cambridge University Press",

address = "United Kingdom",

note = "Microscopy and Microanalysis 2006 ; Conference date: 30-07-2006 Through 03-08-2006",

}

Mcgrouther, D, Mckenzie, W, Saxey, D, Cairney, JM, Marceau, R, Ringer, SP & Munroe, PR 2006, Preparation of Site Specific Atom Probe Tips using Focused Ion Beam Technology. in Microscopy and Microanalysis 2006. vol. 12 S02, Cambridge University Press, Cambridge, UK, pp. 1296-1297, Microscopy and Microanalysis 2006, Chicago, Illinois, United States, 30/07/06. https://doi.org/10.1017/S1431927606062866

TY - GEN

T1 - Preparation of Site Specific Atom Probe Tips using Focused Ion Beam Technology

AU - Mcgrouther, D.

AU - Mckenzie, W.

AU - Saxey, David

AU - Cairney, J.M.

AU - Marceau, R.

AU - Ringer, S.P.

AU - Munroe, P.R.

PY - 2006

Y1 - 2006

U2 - 10.1017/S1431927606062866

DO - 10.1017/S1431927606062866

M3 - Conference paper

SN - 14319276

VL - 12 S02

SP - 1296

EP - 1297

BT - Microscopy and Microanalysis 2006

PB - Cambridge University Press

CY - Cambridge, UK

T2 - Microscopy and Microanalysis 2006

Y2 - 30 July 2006 through 3 August 2006

ER -