Position-Sensitive Detectors in (E,2e) Coincidence Measurements

P. Hayes, M. A. Bennett, J. Flexman, J. F. Williams

    Research output: Contribution to journal › Article

    27 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)2445-2452
    Number of pages8
    JournalReview of Scientific Instruments
    Volume59
    Issue number11
    Publication statusPublished - 1988

    Cite this

    Hayes, P. ; Bennett, M. A. ; Flexman, J. ; Williams, J. F. / Position-Sensitive Detectors in (E,2e) Coincidence Measurements. In: Review of Scientific Instruments. 1988 ; Vol. 59, No. 11. pp. 2445-2452.
    @article{b0fd6ef0fffa4231b029cebf9ba1d864,
    title = "Position-Sensitive Detectors in (E,2e) Coincidence Measurements",
    author = "P. Hayes and Bennett, {M. A.} and J. Flexman and Williams, {J. F.}",
    year = "1988",
    language = "English",
    volume = "59",
    pages = "2445--2452",
    journal = "Review of Scientific Instruments",
    issn = "0034-6748",
    publisher = "American Institute of Physics",
    number = "11",

    }

    Hayes, P, Bennett, MA, Flexman, J & Williams, JF 1988, 'Position-Sensitive Detectors in (E,2e) Coincidence Measurements' Review of Scientific Instruments, vol. 59, no. 11, pp. 2445-2452.

    Position-Sensitive Detectors in (E,2e) Coincidence Measurements. / Hayes, P.; Bennett, M. A.; Flexman, J.; Williams, J. F.

    In: Review of Scientific Instruments, Vol. 59, No. 11, 1988, p. 2445-2452.

    Research output: Contribution to journal › Article

    TY - JOUR

    T1 - Position-Sensitive Detectors in (E,2e) Coincidence Measurements

    AU - Hayes, P.

    AU - Bennett, M. A.

    AU - Flexman, J.

    AU - Williams, J. F.

    PY - 1988

    Y1 - 1988

    M3 - Article

    VL - 59

    SP - 2445

    EP - 2452

    JO - Review of Scientific Instruments

    JF - Review of Scientific Instruments

    SN - 0034-6748

    IS - 11

    ER -

    Hayes P, Bennett MA, Flexman J, Williams JF. Position-Sensitive Detectors in (E,2e) Coincidence Measurements. Review of Scientific Instruments. 1988;59(11):2445-2452.