Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier

F. Surre; Brendan Kennedy; P. Landais; S. Philippe; A.L. Bradley

doi:10.1109/ICTON.2006.248365

Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier

F. Surre, Brendan Kennedy, P. Landais, S. Philippe, A.L. Bradley

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	Proceedings of 2006 International Conference on Transparent Optical Networks
Place of Publication	10.1109/ICTON.2006.248365
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	169-172
Volume	2
Edition	Nottingham, England
ISBN (Print)	9781424402366
DOIs	https://doi.org/10.1109/ICTON.2006.248365
Publication status	Published - 2006
Event	Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier - Nottingham, England Duration: 1 Jan 2006 → …

Conference

Conference	Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier
Period	1/01/06 → …

Access to Document

10.1109/ICTON.2006.248365

Cite this

Surre, F., Kennedy, B., Landais, P., Philippe, S., & Bradley, A. L. (2006). Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier. In Proceedings of 2006 International Conference on Transparent Optical Networks (Nottingham, England ed., Vol. 2, pp. 169-172). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICTON.2006.248365

Surre, F. ; Kennedy, Brendan ; Landais, P. et al. / Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier. Proceedings of 2006 International Conference on Transparent Optical Networks. Vol. 2 Nottingham, England. ed. 10.1109/ICTON.2006.248365 : IEEE, Institute of Electrical and Electronics Engineers, 2006. pp. 169-172

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title = "Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier",

author = "F. Surre and Brendan Kennedy and P. Landais and S. Philippe and A.L. Bradley",

year = "2006",

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language = "English",

isbn = "9781424402366",

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booktitle = "Proceedings of 2006 International Conference on Transparent Optical Networks",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

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note = "Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier ; Conference date: 01-01-2006",

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Surre, F, Kennedy, B, Landais, P, Philippe, S & Bradley, AL 2006, Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier. in Proceedings of 2006 International Conference on Transparent Optical Networks. Nottingham, England edn, vol. 2, IEEE, Institute of Electrical and Electronics Engineers, 10.1109/ICTON.2006.248365, pp. 169-172, Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier, 1/01/06. https://doi.org/10.1109/ICTON.2006.248365

Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier. / Surre, F.; Kennedy, Brendan; Landais, P. et al.

Proceedings of 2006 International Conference on Transparent Optical Networks. Vol. 2 Nottingham, England. ed. 10.1109/ICTON.2006.248365 : IEEE, Institute of Electrical and Electronics Engineers, 2006. p. 169-172.

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

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Surre F, Kennedy B, Landais P, Philippe S, Bradley AL. Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier. In Proceedings of 2006 International Conference on Transparent Optical Networks. Nottingham, England ed. Vol. 2. 10.1109/ICTON.2006.248365: IEEE, Institute of Electrical and Electronics Engineers. 2006. p. 169-172 https://doi.org/10.1109/ICTON.2006.248365