Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier

F. Surre, Brendan Kennedy, P. Landais, S. Philippe, A.L. Bradley

    Research output: Chapter in Book/Conference paperConference paper

    1 Citation (Scopus)
    Original languageEnglish
    Title of host publicationProceedings of 2006 International Conference on Transparent Optical Networks
    Place of Publication10.1109/ICTON.2006.248365
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages169-172
    Volume2
    EditionNottingham, England
    ISBN (Print)9781424402366
    DOIs
    Publication statusPublished - 2006
    EventPolarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier - Nottingham, England
    Duration: 1 Jan 2006 → …

    Conference

    ConferencePolarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier
    Period1/01/06 → …

    Cite this

    Surre, F., Kennedy, B., Landais, P., Philippe, S., & Bradley, A. L. (2006). Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier. In Proceedings of 2006 International Conference on Transparent Optical Networks (Nottingham, England ed., Vol. 2, pp. 169-172). 10.1109/ICTON.2006.248365: IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICTON.2006.248365
    Surre, F. ; Kennedy, Brendan ; Landais, P. ; Philippe, S. ; Bradley, A.L. / Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier. Proceedings of 2006 International Conference on Transparent Optical Networks. Vol. 2 Nottingham, England. ed. 10.1109/ICTON.2006.248365 : IEEE, Institute of Electrical and Electronics Engineers, 2006. pp. 169-172
    @inproceedings{f8880f805fda4b0bb57f6360953559dd,
    title = "Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier",
    author = "F. Surre and Brendan Kennedy and P. Landais and S. Philippe and A.L. Bradley",
    year = "2006",
    doi = "10.1109/ICTON.2006.248365",
    language = "English",
    isbn = "9781424402366",
    volume = "2",
    pages = "169--172",
    booktitle = "Proceedings of 2006 International Conference on Transparent Optical Networks",
    publisher = "IEEE, Institute of Electrical and Electronics Engineers",
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    Surre, F, Kennedy, B, Landais, P, Philippe, S & Bradley, AL 2006, Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier. in Proceedings of 2006 International Conference on Transparent Optical Networks. Nottingham, England edn, vol. 2, IEEE, Institute of Electrical and Electronics Engineers, 10.1109/ICTON.2006.248365, pp. 169-172, Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier, 1/01/06. https://doi.org/10.1109/ICTON.2006.248365

    Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier. / Surre, F.; Kennedy, Brendan; Landais, P.; Philippe, S.; Bradley, A.L.

    Proceedings of 2006 International Conference on Transparent Optical Networks. Vol. 2 Nottingham, England. ed. 10.1109/ICTON.2006.248365 : IEEE, Institute of Electrical and Electronics Engineers, 2006. p. 169-172.

    Research output: Chapter in Book/Conference paperConference paper

    TY - GEN

    T1 - Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier

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    AU - Landais, P.

    AU - Philippe, S.

    AU - Bradley, A.L.

    PY - 2006

    Y1 - 2006

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    M3 - Conference paper

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    BT - Proceedings of 2006 International Conference on Transparent Optical Networks

    PB - IEEE, Institute of Electrical and Electronics Engineers

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    Surre F, Kennedy B, Landais P, Philippe S, Bradley AL. Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier. In Proceedings of 2006 International Conference on Transparent Optical Networks. Nottingham, England ed. Vol. 2. 10.1109/ICTON.2006.248365: IEEE, Institute of Electrical and Electronics Engineers. 2006. p. 169-172 https://doi.org/10.1109/ICTON.2006.248365