Phase Contrast Imaging with Coded Apertures Using Laboratory-Based X-ray Sources

K. Ignatyev, Peter Munro, R.D. Speller, A. Olivo

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	The 10th International Conference on X-ray Microscopy
Place of Publication	United States
Publisher	American Institute of Physics
Pages	254-257
Volume	1365
ISBN (Print)	9780735409255
DOIs	https://doi.org/10.1063/1.3625352
Publication status	Published - 2011
Event	The 10th International Conference on X-ray Microscopy - Chicago, United States Duration: 15 Aug 2010 → 20 Aug 2010

Conference	The 10th International Conference on X-ray Microscopy
Country/Territory	United States
City	Chicago
Period	15/08/10 → 20/08/10

Access to Document

@inproceedings{6ca4e5ebbb354c4b959001456c568f86,

title = "Phase Contrast Imaging with Coded Apertures Using Laboratory-Based X-ray Sources",

author = "K. Ignatyev and Peter Munro and R.D. Speller and A. Olivo",

year = "2011",

doi = "10.1063/1.3625352",

language = "English",

isbn = "9780735409255",

volume = "1365",

pages = "254--257",

booktitle = "The 10th International Conference on X-ray Microscopy",

publisher = "American Institute of Physics",

address = "United States",

note = "The 10th International Conference on X-ray Microscopy ; Conference date: 15-08-2010 Through 20-08-2010",

}

Ignatyev, K, Munro, P, Speller, RD & Olivo, A 2011, Phase Contrast Imaging with Coded Apertures Using Laboratory-Based X-ray Sources. in The 10th International Conference on X-ray Microscopy. vol. 1365, American Institute of Physics, United States, pp. 254-257, The 10th International Conference on X-ray Microscopy, Chicago, United States, 15/08/10. https://doi.org/10.1063/1.3625352

TY - GEN

T1 - Phase Contrast Imaging with Coded Apertures Using Laboratory-Based X-ray Sources

AU - Ignatyev, K.

AU - Munro, Peter

AU - Speller, R.D.

AU - Olivo, A.

PY - 2011

Y1 - 2011

U2 - 10.1063/1.3625352

DO - 10.1063/1.3625352

M3 - Conference paper

SN - 9780735409255

VL - 1365

SP - 254

EP - 257

BT - The 10th International Conference on X-ray Microscopy

PB - American Institute of Physics

CY - United States

T2 - The 10th International Conference on X-ray Microscopy

Y2 - 15 August 2010 through 20 August 2010

ER -