Pb quantification of CdZnTe microheterogeneites complimented by SEM, IR microscopy, EDX, and TOF-SIMS

M. Bliss; D.C. Gerlach; John Cliff; M.B. Toloczko; D.S. Barnett; G. Ciampi; K.A. Jones; K.G. Lynn

doi:10.1016/j.nima.2007.04.018

Pb quantification of CdZnTe microheterogeneites complimented by SEM, IR microscopy, EDX, and TOF-SIMS

M. Bliss, D.C. Gerlach, John Cliff, M.B. Toloczko, D.S. Barnett, G. Ciampi, K.A. Jones, K.G. Lynn

Centre for Microscopy, Characterisation & Analysis

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

High-resistivity crystals of CdZnTe are made using low-pressure Bridgman. The success of any doping scheme depends on its effectiveness in overcoming trace contamination and variations in processing. Multiple imaging and quantitative techniques gave highly complimentary information relating to spatial heterogeneity of the cadmium zinc telluride (CZT). Secondary Ion Mass Spectroscopy (SIMS) has good sensitivity and can quantitate trace elements in areas less than 150 μm in diameter. PNNL has SIMS standards for several key elements and can extrapolate for other elements. A heavily Pb-doped sample (0.1 atm%) was characterized to determine the distribution of lead and its potential impact on precipitates.

Original language	English
Pages (from-to)	138-140
Journal	Nuclear Instruments and Methods in Physics Research Section A
Volume	579
Issue number	1
DOIs	https://doi.org/10.1016/j.nima.2007.04.018
Publication status	Published - 2007

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title = "Pb quantification of CdZnTe microheterogeneites complimented by SEM, IR microscopy, EDX, and TOF-SIMS",

abstract = "High-resistivity crystals of CdZnTe are made using low-pressure Bridgman. The success of any doping scheme depends on its effectiveness in overcoming trace contamination and variations in processing. Multiple imaging and quantitative techniques gave highly complimentary information relating to spatial heterogeneity of the cadmium zinc telluride (CZT). Secondary Ion Mass Spectroscopy (SIMS) has good sensitivity and can quantitate trace elements in areas less than 150 μm in diameter. PNNL has SIMS standards for several key elements and can extrapolate for other elements. A heavily Pb-doped sample (0.1 atm%) was characterized to determine the distribution of lead and its potential impact on precipitates.",

author = "M. Bliss and D.C. Gerlach and John Cliff and M.B. Toloczko and D.S. Barnett and G. Ciampi and K.A. Jones and K.G. Lynn",

year = "2007",

doi = "10.1016/j.nima.2007.04.018",

language = "English",

volume = "579",

pages = "138--140",

journal = "Nuclear Instruments and Methods in Physics Research Section A",

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TY - JOUR

T1 - Pb quantification of CdZnTe microheterogeneites complimented by SEM, IR microscopy, EDX, and TOF-SIMS

AU - Bliss, M.

AU - Gerlach, D.C.

AU - Cliff, John

AU - Toloczko, M.B.

AU - Barnett, D.S.

AU - Ciampi, G.

AU - Jones, K.A.

AU - Lynn, K.G.

PY - 2007

Y1 - 2007

N2 - High-resistivity crystals of CdZnTe are made using low-pressure Bridgman. The success of any doping scheme depends on its effectiveness in overcoming trace contamination and variations in processing. Multiple imaging and quantitative techniques gave highly complimentary information relating to spatial heterogeneity of the cadmium zinc telluride (CZT). Secondary Ion Mass Spectroscopy (SIMS) has good sensitivity and can quantitate trace elements in areas less than 150 μm in diameter. PNNL has SIMS standards for several key elements and can extrapolate for other elements. A heavily Pb-doped sample (0.1 atm%) was characterized to determine the distribution of lead and its potential impact on precipitates.

AB - High-resistivity crystals of CdZnTe are made using low-pressure Bridgman. The success of any doping scheme depends on its effectiveness in overcoming trace contamination and variations in processing. Multiple imaging and quantitative techniques gave highly complimentary information relating to spatial heterogeneity of the cadmium zinc telluride (CZT). Secondary Ion Mass Spectroscopy (SIMS) has good sensitivity and can quantitate trace elements in areas less than 150 μm in diameter. PNNL has SIMS standards for several key elements and can extrapolate for other elements. A heavily Pb-doped sample (0.1 atm%) was characterized to determine the distribution of lead and its potential impact on precipitates.

U2 - 10.1016/j.nima.2007.04.018

DO - 10.1016/j.nima.2007.04.018

M3 - Article

SN - 0168-9002

VL - 579

SP - 138

EP - 140

JO - Nuclear Instruments and Methods in Physics Research Section A

JF - Nuclear Instruments and Methods in Physics Research Section A

IS - 1

ER -

Pb quantification of CdZnTe microheterogeneites complimented by SEM, IR microscopy, EDX, and TOF-SIMS

Abstract

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