Parameter identification for semiconductor diodes by LBIC imaging

Research output: Contribution to journal › Article › peer-review

22 Citations (Scopus)

Original language	English
Pages (from-to)	2149-2174
Journal	SIAM Journal on Applied Mathematics
Volume	62
Issue number	6
DOIs	https://doi.org/10.1137/S003613990139249X
Publication status	Published - 2002

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@article{b7dad8f5e9d64f809d73c548c9bbf584,

title = "Parameter identification for semiconductor diodes by LBIC imaging",

author = "W. Fang and K. Ito and D.A. Redfern",

year = "2002",

doi = "10.1137/S003613990139249X",

language = "English",

volume = "62",

pages = "2149--2174",

journal = "SIAM Journal on Applied Mathematics",

issn = "0036-1399",

publisher = "Society for Industrial and Applied Mathematics Publications",

number = "6",

}