Parameter identification for semiconductor diodes by LBIC imaging

W. Fang, K. Ito, D.A. Redfern

Research output: Contribution to journalArticle

20 Citations (Scopus)
Original languageEnglish
Pages (from-to)2149-2174
JournalSIAM Journal on Applied Mathematics
Volume62
Issue number6
DOIs
Publication statusPublished - 2002

Cite this

Fang, W. ; Ito, K. ; Redfern, D.A. / Parameter identification for semiconductor diodes by LBIC imaging. In: SIAM Journal on Applied Mathematics. 2002 ; Vol. 62, No. 6. pp. 2149-2174.
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Parameter identification for semiconductor diodes by LBIC imaging. / Fang, W.; Ito, K.; Redfern, D.A.

In: SIAM Journal on Applied Mathematics, Vol. 62, No. 6, 2002, p. 2149-2174.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Parameter identification for semiconductor diodes by LBIC imaging

AU - Fang, W.

AU - Ito, K.

AU - Redfern, D.A.

PY - 2002

Y1 - 2002

U2 - 10.1137/S003613990139249X

DO - 10.1137/S003613990139249X

M3 - Article

VL - 62

SP - 2149

EP - 2174

JO - SIAM Journal on Applied Mathematics

JF - SIAM Journal on Applied Mathematics

SN - 0036-1399

IS - 6

ER -