On-Chip Skin Detection for Color CMOS Imagers

Farid Boussaid; D. Chai; A. Bouzerdoum

On-Chip Skin Detection for Color CMOS Imagers

Farid Boussaid, D. Chai, A. Bouzerdoum

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	Proceedings International Conference on MEMS, NANO and Smart Systems ICMENS 2003
Editors	Wael Badawy, Walied Moussa
Place of Publication	United States of America
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	357-361
Volume	1
Edition	Banff, Alberta, Canada
ISBN (Print)	0769519474
Publication status	Published - 2003
Event	On-Chip Skin Detection for Color CMOS Imagers - Banff, Alberta, Canada Duration: 1 Jan 2003 → …

Conference

Conference	On-Chip Skin Detection for Color CMOS Imagers
Period	1/01/03 → …

Cite this

@inproceedings{cc87a6445e6f4af08f58d16c1ba7bec6,

title = "On-Chip Skin Detection for Color CMOS Imagers",

author = "Farid Boussaid and D. Chai and A. Bouzerdoum",

year = "2003",

language = "English",

isbn = "0769519474",

volume = "1",

pages = "357--361",

editor = "Wael Badawy and Walied Moussa",

booktitle = "Proceedings International Conference on MEMS, NANO and Smart Systems ICMENS 2003",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

edition = "Banff, Alberta, Canada",

note = "On-Chip Skin Detection for Color CMOS Imagers ; Conference date: 01-01-2003",

}

Boussaid, F, Chai, D & Bouzerdoum, A 2003, On-Chip Skin Detection for Color CMOS Imagers. in W Badawy & W Moussa (eds), Proceedings International Conference on MEMS, NANO and Smart Systems ICMENS 2003. Banff, Alberta, Canada edn, vol. 1, IEEE, Institute of Electrical and Electronics Engineers, United States of America, pp. 357-361, On-Chip Skin Detection for Color CMOS Imagers, 1/01/03.

On-Chip Skin Detection for Color CMOS Imagers. / Boussaid, Farid; Chai, D.; Bouzerdoum, A.

Proceedings International Conference on MEMS, NANO and Smart Systems ICMENS 2003. ed. / Wael Badawy; Walied Moussa. Vol. 1 Banff, Alberta, Canada. ed. United States of America : IEEE, Institute of Electrical and Electronics Engineers, 2003. p. 357-361.

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

TY - GEN

T1 - On-Chip Skin Detection for Color CMOS Imagers

AU - Boussaid, Farid

AU - Chai, D.

AU - Bouzerdoum, A.

PY - 2003

Y1 - 2003

M3 - Conference paper

SN - 0769519474

VL - 1

SP - 357

EP - 361

BT - Proceedings International Conference on MEMS, NANO and Smart Systems ICMENS 2003

A2 - Badawy, Wael

A2 - Moussa, Walied

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - United States of America

T2 - On-Chip Skin Detection for Color CMOS Imagers

Y2 - 1 January 2003

ER -