Ollie was right! a review of angular dependence, detector bandwidth and sample preparation on contrast in secondary and backscattered electron images in the SEM

Brendan Griffin; D.C. Joy; J.R. Michael

doi:10.1017/S1431927614001792

Ollie was right! a review of angular dependence, detector bandwidth and sample preparation on contrast in secondary and backscattered electron images in the SEM

Brendan Griffin, D.C. Joy, J.R. Michael

Centre for Microscopy, Characterisation & Analysis

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Microscopy and Microanalysis 2014
Pages	14-15
Volume	20
DOIs	https://doi.org/10.1017/S1431927614001792
Publication status	Published - 2014
Event	Ollie was right! a review of angular dependence, detector bandwidth and sample preparation on contrast in secondary and backscattered electron images in the SEM - Connecticut, United States Duration: 1 Jan 2014 → …

Conference

Conference	Ollie was right! a review of angular dependence, detector bandwidth and sample preparation on contrast in secondary and backscattered electron images in the SEM
Period	1/01/14 → …

Access to Document

10.1017/S1431927614001792

Cite this

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title = "Ollie was right! a review of angular dependence, detector bandwidth and sample preparation on contrast in secondary and backscattered electron images in the SEM",

author = "Brendan Griffin and D.C. Joy and J.R. Michael",

year = "2014",

doi = "10.1017/S1431927614001792",

language = "English",

isbn = "14319276",

volume = "20",

pages = "14--15",

booktitle = "Microscopy and Microanalysis 2014",

note = "Ollie was right! a review of angular dependence, detector bandwidth and sample preparation on contrast in secondary and backscattered electron images in the SEM ; Conference date: 01-01-2014",

}

Griffin, B, Joy, DC & Michael, JR 2014, Ollie was right! a review of angular dependence, detector bandwidth and sample preparation on contrast in secondary and backscattered electron images in the SEM. in Microscopy and Microanalysis 2014. vol. 20, pp. 14-15, Ollie was right! a review of angular dependence, detector bandwidth and sample preparation on contrast in secondary and backscattered electron images in the SEM, 1/01/14. https://doi.org/10.1017/S1431927614001792

TY - GEN

T1 - Ollie was right! a review of angular dependence, detector bandwidth and sample preparation on contrast in secondary and backscattered electron images in the SEM

AU - Griffin, Brendan

AU - Joy, D.C.

AU - Michael, J.R.

PY - 2014

Y1 - 2014

U2 - 10.1017/S1431927614001792

DO - 10.1017/S1431927614001792

M3 - Conference paper

SN - 14319276

VL - 20

SP - 14

EP - 15

BT - Microscopy and Microanalysis 2014

T2 - Ollie was right! a review of angular dependence, detector bandwidth and sample preparation on contrast in secondary and backscattered electron images in the SEM

Y2 - 1 January 2014

ER -